{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,21]],"date-time":"2026-04-21T16:38:32Z","timestamp":1776789512478,"version":"3.51.2"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T00:00:00Z","timestamp":1727740800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U20A20310"],"award-info":[{"award-number":["U20A20310"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52176199"],"award-info":[{"award-number":["52176199"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Program of Shanghai Academic/Technology Research Leader","award":["22XD1423800"],"award-info":[{"award-number":["22XD1423800"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,10]]},"DOI":"10.1109\/tie.2023.3342289","type":"journal-article","created":{"date-parts":[[2024,1,3]],"date-time":"2024-01-03T19:36:46Z","timestamp":1704310606000},"page":"13201-13210","source":"Crossref","is-referenced-by-count":56,"title":["Quantitative Diagnosis of Internal Short Circuit for Lithium-Ion Batteries Using Relaxation Voltage"],"prefix":"10.1109","volume":"71","author":[{"given":"Dongdong","family":"Qiao","sequence":"first","affiliation":[{"name":"Clean Energy Automotive Engineering Center, School of Automotive Studies, Tongji University, Shanghai, China"}]},{"given":"Xuezhe","family":"Wei","sequence":"additional","affiliation":[{"name":"Clean Energy Automotive Engineering Center, School of Automotive Studies, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5240-4996","authenticated-orcid":false,"given":"Bo","family":"Jiang","sequence":"additional","affiliation":[{"name":"Postdoctoral Station of Mechanical Engineering, School of Automotive Studies, Tongji University, Shanghai, China"}]},{"given":"Wenjun","family":"Fan","sequence":"additional","affiliation":[{"name":"Clean Energy Automotive Engineering Center, School of Automotive Studies, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2190-6023","authenticated-orcid":false,"given":"Xin","family":"Lai","sequence":"additional","affiliation":[{"name":"College of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}]},{"given":"Yuejiu","family":"Zheng","sequence":"additional","affiliation":[{"name":"College of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5322-2019","authenticated-orcid":false,"given":"Haifeng","family":"Dai","sequence":"additional","affiliation":[{"name":"Clean Energy Automotive Engineering Center, School of Automotive Studies, Tongji University, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2973876"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-023-06235-w"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2889623"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2021.105908"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2020.110480"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2020.115855"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.06.087"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838109"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3063968"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2015.10.019"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2019.101085"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2019.01.058"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3098445"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2020.120277"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2016.11.007"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2020.228964"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2016.12.143"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2018.05.097"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2021.123082"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2022.119168"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1149\/1945-7111\/ab9b0b"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/aenm.202003868"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.joule.2019.07.026"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3052579"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2022.232064"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2023.232824"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-022-29837-w"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2022.120308"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2020.228360"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2013.09.022"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1149\/2.0731713jes"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.joule.2018.06.015"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2021.103558"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10589496\/10380230.pdf?arnumber=10380230","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,16]],"date-time":"2024-12-16T19:23:20Z","timestamp":1734377000000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10380230\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10]]},"references-count":33,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3342289","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,10]]}}}