{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T17:56:10Z","timestamp":1775325370760,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"China Heilongjiang Provincial Key R&D Program","award":["JD22A002"],"award-info":[{"award-number":["JD22A002"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52177036"],"award-info":[{"award-number":["52177036"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,11]]},"DOI":"10.1109\/tie.2024.3363733","type":"journal-article","created":{"date-parts":[[2024,2,27]],"date-time":"2024-02-27T19:16:05Z","timestamp":1709061365000},"page":"15089-15099","source":"Crossref","is-referenced-by-count":30,"title":["Fault Diagnosis and Separation of PMSM Rotor Faults Using Search Coil Based on MVSA and Random Forests"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7412-4431","authenticated-orcid":false,"given":"Bochao","family":"Du","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1633-5211","authenticated-orcid":false,"given":"Wan","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9706-1077","authenticated-orcid":false,"given":"Yuan","family":"Cheng","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-9566-8355","authenticated-orcid":false,"given":"Jinfeng","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9810-0410","authenticated-orcid":false,"given":"Ruichao","family":"Tao","sequence":"additional","affiliation":[{"name":"AVIC China aero-polytechnology establishment, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1931-4689","authenticated-orcid":false,"given":"Shumei","family":"Cui","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2963197"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2608950"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3159947"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2726072"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.rinp.2018.06.044"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3131576"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2634518"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2617318"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2511003"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3121788"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2864570"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2037922"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2018.2819627"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2176127"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2609380"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3071598"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2176127"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2512602"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2558183"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3088332"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2151810"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2227808"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3058541"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3095810"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3066960"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2017.0403"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2962470"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2669480"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2360070"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2686376"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3134991"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2443711"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3212402"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2013.2282152"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2017.0865"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3113384"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3213512"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3063979"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1021\/acs.est.2c07073"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10639503\/10449721.pdf?arnumber=10449721","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,16]],"date-time":"2024-12-16T19:24:09Z","timestamp":1734377049000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10449721\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11]]},"references-count":39,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3363733","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,11]]}}}