{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T17:51:46Z","timestamp":1775325106681,"version":"3.50.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52277051"],"award-info":[{"award-number":["52277051"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52177046"],"award-info":[{"award-number":["52177046"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFB2502703"],"award-info":[{"award-number":["2022YFB2502703"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,11]]},"DOI":"10.1109\/tie.2024.3363740","type":"journal-article","created":{"date-parts":[[2024,2,22]],"date-time":"2024-02-22T19:37:14Z","timestamp":1708630634000},"page":"13801-13811","source":"Crossref","is-referenced-by-count":42,"title":["New Flux Intensifying Technique for Five-Phase Fault-Tolerant Interior Permanent Magnet Motors Under Multiple Sensorless Operation"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5308-8988","authenticated-orcid":false,"given":"Li","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-0847-1678","authenticated-orcid":false,"given":"Sisi","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6333-3329","authenticated-orcid":false,"given":"Xiaoyong","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3818-0599","authenticated-orcid":false,"given":"Zixuan","family":"Xiang","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3130475"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3225228"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3195495"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3182820"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3049466"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3093361"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/ip-b.1993.0031"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2014.0336"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2956381"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2958792"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3156155"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3241089"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2849961"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2022.3213571"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3174281"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2955407"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3241177"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2951760"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3228510"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2023.3347637"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3233\/JAE-170015"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2975766"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2168794"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10639500\/10443787.pdf?arnumber=10443787","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,20]],"date-time":"2024-08-20T15:39:33Z","timestamp":1724168373000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10443787\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11]]},"references-count":23,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3363740","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,11]]}}}