{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T04:50:46Z","timestamp":1780375846942,"version":"3.54.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Science Research Project of Hebei Education Department","award":["QN2024064"],"award-info":[{"award-number":["QN2024064"]}]},{"name":"High-level Talent Research Startup Project of Hebei University","award":["521100222019"],"award-info":[{"award-number":["521100222019"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62103367"],"award-info":[{"award-number":["62103367"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004750","name":"Aeronautical Science Foundation of China","doi-asserted-by":"publisher","award":["20230040069002"],"award-info":[{"award-number":["20230040069002"]}],"id":[{"id":"10.13039\/501100004750","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Start-up Research Fund of Southeast University","award":["RF1028623278"],"award-info":[{"award-number":["RF1028623278"]}]},{"name":"Hebei University Research and Innovation Team Project","award":["IT202306"],"award-info":[{"award-number":["IT202306"]}]},{"name":"Baoding Science and Technology Plan Project","award":["2372P010"],"award-info":[{"award-number":["2372P010"]}]},{"name":"S&amp;T Program of Hebei","award":["236Z4411G"],"award-info":[{"award-number":["236Z4411G"]}]},{"name":"ANID&#x002F;FONDECYT","award":["1231265"],"award-info":[{"award-number":["1231265"]}]},{"name":"ANID&#x002F;FONDECYT","award":["1230250"],"award-info":[{"award-number":["1230250"]}]},{"name":"Basal Project","award":["FB0008"],"award-info":[{"award-number":["FB0008"]}]},{"DOI":"10.13039\/501100020884","name":"Agencia Nacional de Investigaci\u00f3n y Desarrollo","doi-asserted-by":"publisher","award":["FB0008"],"award-info":[{"award-number":["FB0008"]}],"id":[{"id":"10.13039\/501100020884","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100020884","name":"Agencia Nacional de Investigaci\u00f3n y Desarrollo","doi-asserted-by":"publisher","award":["1210208"],"award-info":[{"award-number":["1210208"]}],"id":[{"id":"10.13039\/501100020884","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100020884","name":"Agencia Nacional de Investigaci\u00f3n y Desarrollo","doi-asserted-by":"publisher","award":["1221293"],"award-info":[{"award-number":["1221293"]}],"id":[{"id":"10.13039\/501100020884","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,11]]},"DOI":"10.1109\/tie.2024.3366215","type":"journal-article","created":{"date-parts":[[2024,3,8]],"date-time":"2024-03-08T18:49:41Z","timestamp":1709923781000},"page":"13614-13624","source":"Crossref","is-referenced-by-count":6,"title":["Flux-Weakening Scheme for Four-Switch Inverter-Fed IM Drives With Optimized Overmodulation-Based Modulated Predictive Torque Control"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9162-0659","authenticated-orcid":false,"given":"Ze","family":"Li","sequence":"first","affiliation":[{"name":"College of Electronic and Information Engineering, Hebei University, Baoding, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7247-7201","authenticated-orcid":false,"given":"Jinhui","family":"Xia","sequence":"additional","affiliation":[{"name":"School of Automation, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0442-1932","authenticated-orcid":false,"given":"Xiaonan","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Computer Science, KTH Royal Institute of Technology, Stockholm, Sweden"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7939-422X","authenticated-orcid":false,"given":"Cristian","family":"Garcia","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Universidad de Talca, Curico, Chile"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1410-4121","authenticated-orcid":false,"given":"Jose","family":"Rodriguez","sequence":"additional","affiliation":[{"name":"Faculty of Engineering, Universidad San Sebastian, Santiago, Chile"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1309-7572","authenticated-orcid":false,"given":"Yuanbo","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Dalian University of Technology, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3478-2859","authenticated-orcid":false,"given":"Xiaohua","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Dalian University of Technology, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3176269"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2956042"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2625768"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2850006"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3225831"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2532477"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2850006"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2225449"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2884759"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2834559"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2968387"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3114716"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2338395"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880699"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3064979"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3236088"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3193674"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2911209"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2878877"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3200976"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2908342"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3239938"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/28.175288"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2020.3048306"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/41.605628"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2886206"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.23919\/ICEMS.2018.8549382"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1541\/ieejjia.8.548"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3267078"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2173095"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2023.3281742"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/63.728341"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2971084"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3023927"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2828198"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3196387"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2889622"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.23919\/ChiCC.2017.8028519"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10639500\/10461492.pdf?arnumber=10461492","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,20]],"date-time":"2024-08-20T15:40:02Z","timestamp":1724168402000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10461492\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11]]},"references-count":38,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3366215","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,11]]}}}