{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,27]],"date-time":"2025-07-27T07:28:34Z","timestamp":1753601314912,"version":"3.37.3"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000266","name":"UK Engineering and Physical Research Council","doi-asserted-by":"publisher","award":["EP\/Y000307\/1"],"award-info":[{"award-number":["EP\/Y000307\/1"]}],"id":[{"id":"10.13039\/501100000266","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,12]]},"DOI":"10.1109\/tie.2024.3383026","type":"journal-article","created":{"date-parts":[[2024,4,26]],"date-time":"2024-04-26T17:59:24Z","timestamp":1714154364000},"page":"15599-15609","source":"Crossref","is-referenced-by-count":4,"title":["Impact of Intrinsic Parameter Dispersion on Short-Circuit Reliability of Parallel-Connected Planar and Trench SiC MOSFETs"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4568-9513","authenticated-orcid":false,"given":"Renze","family":"Yu","sequence":"first","affiliation":[{"name":"Electrical Energy Management Group, School of Electrical and Mechanical Engineering, University of Bristol, Bristol, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6471-0429","authenticated-orcid":false,"given":"Saeed","family":"Jahdi","sequence":"additional","affiliation":[{"name":"Electrical Energy Management Group, School of Electrical and Mechanical Engineering, University of Bristol, Bristol, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1531-6676","authenticated-orcid":false,"given":"Phil","family":"Mellor","sequence":"additional","affiliation":[{"name":"Electrical Energy Management Group, School of Electrical and Mechanical Engineering, University of Bristol, Bristol, U.K."}]}],"member":"263","container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10723150\/10509665.pdf?arnumber=10509665","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,16]],"date-time":"2024-12-16T19:24:05Z","timestamp":1734377045000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10509665\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12]]},"references-count":0,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3383026","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2024,12]]}}}