{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,14]],"date-time":"2026-02-14T03:01:31Z","timestamp":1771038091417,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52277066"],"award-info":[{"award-number":["52277066"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"State Key Laboratory of Electrical Insulation and Power Equipment Foundation","award":["EIPE23131"],"award-info":[{"award-number":["EIPE23131"]}]},{"DOI":"10.13039\/501100012130","name":"Chinese Aeronautical Establishment","doi-asserted-by":"publisher","award":["20230040070001"],"award-info":[{"award-number":["20230040070001"]}],"id":[{"id":"10.13039\/501100012130","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,12]]},"DOI":"10.1109\/tie.2024.3390724","type":"journal-article","created":{"date-parts":[[2024,5,14]],"date-time":"2024-05-14T17:31:01Z","timestamp":1715707861000},"page":"15424-15434","source":"Crossref","is-referenced-by-count":8,"title":["Analysis of a Novel Dual Winding Dual Magnet Machine With Compound Fault-Tolerance Capability"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6041-6564","authenticated-orcid":false,"given":"Pengcheng","family":"Sun","sequence":"first","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4789-2320","authenticated-orcid":false,"given":"Shaofeng","family":"Jia","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-2418-7463","authenticated-orcid":false,"given":"Dongxu","family":"Yang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-9186-4522","authenticated-orcid":false,"given":"Ziwei","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2394-1781","authenticated-orcid":false,"given":"Deliang","family":"Liang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2020.2997609"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2010.2045522"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2017.0274"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2023.3340750"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3090714"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2090930"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2006.877716"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.2005374"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2447733"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3241177"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2610941"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2876400"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3267786"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3265418"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2724505"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3058200"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2875636"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2902816"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2894872"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3227887"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/advs.202003739"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MVT.2012.2218438"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICEM51905.2022.9910881"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3377454"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2020.2986395"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3173896"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3075844"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.30941\/CESTEMS.2022.00014"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2829669"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10723150\/10530313.pdf?arnumber=10530313","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,14]],"date-time":"2025-01-14T19:51:27Z","timestamp":1736884287000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10530313\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12]]},"references-count":29,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3390724","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,12]]}}}