{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T12:40:08Z","timestamp":1780317608410,"version":"3.54.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62271109"],"award-info":[{"award-number":["62271109"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,12]]},"DOI":"10.1109\/tie.2024.3398673","type":"journal-article","created":{"date-parts":[[2024,6,6]],"date-time":"2024-06-06T17:27:09Z","timestamp":1717694829000},"page":"15521-15531","source":"Crossref","is-referenced-by-count":11,"title":["Online Current Optimization Based Fault-Tolerant Control of Standard PMSM Drives"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4509-9086","authenticated-orcid":false,"given":"Yun","family":"Zhang","sequence":"first","affiliation":[{"name":"National Key Laboratory of Optical Field Manipulation Science and Technology, the Key Laboratory of Optical Engineering, and the Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1282-5881","authenticated-orcid":false,"given":"Xinglong","family":"Chen","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Optical Field Manipulation Science and Technology, the Key Laboratory of Optical Engineering, and the Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8173-3331","authenticated-orcid":false,"given":"Xueqing","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-6070-9745","authenticated-orcid":false,"given":"Ting","family":"Zhang","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Optical Field Manipulation Science and Technology, the Key Laboratory of Optical Engineering, and the Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5330-4532","authenticated-orcid":false,"given":"Zheng","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1785-2018","authenticated-orcid":false,"given":"Yao","family":"Mao","sequence":"additional","affiliation":[{"name":"National Key Laboratory of Optical Field Manipulation Science and Technology, the Key Laboratory of Optical Engineering, and the Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3039205"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2019.2962333"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3023140"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2402645"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2360834"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2535960"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301712"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2004.830074"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICElMach.2012.6350221"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2931285"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2135866"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2925823"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2022.3199785"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3239853"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2850006"},{"key":"ref16","first-page":"1","article-title":"A fault-tolerant permanent magnet synchronous motor drive with integrated voltage source inverter open-circuit faults diagnosis","volume-title":"Proc. 14th Eur. Conf. Power Electron. Appl.","author":"Estima","year":"2011"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3048070"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2039982"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2325891"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2143430"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2012.0543"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2437357"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2017.8002217"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3146216"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3036041"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2023.3306457"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2592534"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.7305\/automatika.2014.12.624"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10723150\/10551271.pdf?arnumber=10551271","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T00:57:49Z","timestamp":1732669069000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10551271\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12]]},"references-count":28,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3398673","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,12]]}}}