{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T16:48:43Z","timestamp":1774630123914,"version":"3.50.1"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,12,1]],"date-time":"2024-12-01T00:00:00Z","timestamp":1733011200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2024,12]]},"DOI":"10.1109\/tie.2024.3401202","type":"journal-article","created":{"date-parts":[[2024,6,12]],"date-time":"2024-06-12T17:38:49Z","timestamp":1718213929000},"page":"15543-15553","source":"Crossref","is-referenced-by-count":5,"title":["A Novel Hybrid-Magnetic-Circuit Memory Machine With Variable-Leakage-Flux Capability"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2885-3876","authenticated-orcid":false,"given":"Xifang","family":"Zhao","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1605-7493","authenticated-orcid":false,"given":"Heyun","family":"Lin","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8242-9940","authenticated-orcid":false,"given":"Yuxiang","family":"Zhong","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2867-5574","authenticated-orcid":false,"given":"Hui","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7311-7021","authenticated-orcid":false,"given":"Xianxian","family":"Zeng","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3301-3740","authenticated-orcid":false,"given":"Xiping","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Jiangxi University of Science and Technology, Ganzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MCE.2018.2880848"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2868280"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.918403"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301754"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MVT.2012.2218438"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2002.803013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.2001.955983"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2273482"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2461621"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2701340"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2709261"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2844824"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2879858"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2507262"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3068329"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2014.0319"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2443023"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2931494"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3236099"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3174293"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2022.3157788"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2020.3013624"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2464190"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3116588"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3016253"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CEFC55061.2022.9940885"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10723150\/10555139.pdf?arnumber=10555139","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T01:00:42Z","timestamp":1732669242000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10555139\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,12]]},"references-count":26,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3401202","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,12]]}}}