{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,19]],"date-time":"2026-04-19T16:33:40Z","timestamp":1776616420331,"version":"3.51.2"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000767","name":"National Research Foundation (NRF) of Singapore, Rolls-Royce Singapore Pte. Ltd.","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000767","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001475","name":"Nanyang Technological University, Singapore","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001475","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,1]]},"DOI":"10.1109\/tie.2024.3404148","type":"journal-article","created":{"date-parts":[[2024,6,12]],"date-time":"2024-06-12T17:38:49Z","timestamp":1718213929000},"page":"492-503","source":"Crossref","is-referenced-by-count":25,"title":["Multi-Agent Soft Actor-Critic Aided Active Disturbance Rejection Control of DC Solid-State Transformer"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1929-5537","authenticated-orcid":false,"given":"Yu","family":"Zeng","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1514-3851","authenticated-orcid":false,"given":"Gaowen","family":"Liang","sequence":"additional","affiliation":[{"name":"Energy Research Institute Nanyang Technological University, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3934-9547","authenticated-orcid":false,"given":"Qingxiang","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6156-1774","authenticated-orcid":false,"given":"Ezequiel","family":"Rodriguez","sequence":"additional","affiliation":[{"name":"Energy Research Institute Nanyang Technological University, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3114-781X","authenticated-orcid":false,"given":"Josep","family":"Pou","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2804-6361","authenticated-orcid":false,"given":"Huamin","family":"Jie","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6027-4618","authenticated-orcid":false,"given":"Xiong","family":"Liu","sequence":"additional","affiliation":[{"name":"Energy Electricity Research Center, International Energy College, Jinan University, Zhuhai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4968-2722","authenticated-orcid":false,"given":"Xin","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Zhejiang University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-7623-0492","authenticated-orcid":false,"given":"Janardhana","family":"Kotturu","sequence":"additional","affiliation":[{"name":"Rolls-Royce Singapore Private Limited, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9829-2974","authenticated-orcid":false,"given":"Amit","family":"Gupta","sequence":"additional","affiliation":[{"name":"Rolls-Royce Singapore Private Limited, Singapore"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2049719"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3363737"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2022.3183289"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3154314"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3170608"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2023.3266287"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2984714"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2999034"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2527723"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3107355"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3138126"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3221349"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3192676"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3013774"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2019.1061"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2823364"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3359672"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3118378"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011621"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2751008"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IECON43393.2020.9255011"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2021.3138341"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3220893"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3218900"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2023.3299979"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3024914"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3225829"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3181243"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/iecon51785.2023.10311617"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE47101.2021.9595137"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3055175"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2023.3294584"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10758316\/10555131.pdf?arnumber=10555131","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T17:53:44Z","timestamp":1732730024000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10555131\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1]]},"references-count":32,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3404148","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1]]}}}