{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,29]],"date-time":"2026-07-29T03:57:32Z","timestamp":1785297452340,"version":"3.55.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Young Elite Scientists Sponsorship Program by under CAST","award":["2023QNRC001"],"award-info":[{"award-number":["2023QNRC001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,1]]},"DOI":"10.1109\/tie.2024.3406881","type":"journal-article","created":{"date-parts":[[2024,6,19]],"date-time":"2024-06-19T17:30:20Z","timestamp":1718818220000},"page":"1043-1053","source":"Crossref","is-referenced-by-count":13,"title":["Recurrent EKF Based Inertial Aided Magnetometer Online Calibration for Complex Interference Environment"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6252-4059","authenticated-orcid":false,"given":"Jinwen","family":"Wang","sequence":"first","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0226-0626","authenticated-orcid":false,"given":"Zhihong","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Automation and National Key Laboratory of Intelligent Control and Decision of Complex Systems, Beijing Institute of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3541-6108","authenticated-orcid":false,"given":"Kai","family":"Shen","sequence":"additional","affiliation":[{"name":"School of Automation and National Key Laboratory of Intelligent Control and Decision of Complex Systems, Beijing Institute of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0228-6749","authenticated-orcid":false,"given":"Yuming","family":"Bo","sequence":"additional","affiliation":[{"name":"School of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/isiss.2018.8358125"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2016.2582751"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3134747"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2950841"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.3043352"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/taes.2022.3202143"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2021.3050657"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2375258"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2540659"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2914574"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2910091"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2624821"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2017.2670527"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2720756"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3177762"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2022.3160877"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3060594"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2019.2920367"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2017.2756763"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2941273"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3060652"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3179833"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3275318"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3260300"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3277615"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3260353"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3203875"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2014.2360335"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2017.2667820"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3123951"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10758316\/10564151.pdf?arnumber=10564151","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T00:26:45Z","timestamp":1732667205000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10564151\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1]]},"references-count":30,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3406881","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1]]}}}