{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,29]],"date-time":"2026-05-29T11:10:59Z","timestamp":1780053059538,"version":"3.54.0"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,2]]},"DOI":"10.1109\/tie.2024.3423326","type":"journal-article","created":{"date-parts":[[2024,7,23]],"date-time":"2024-07-23T19:28:59Z","timestamp":1721762939000},"page":"2078-2088","source":"Crossref","is-referenced-by-count":3,"title":["A Method for Constructing Short-Time AC Voltage Generator to Evaluate Cable Conditions"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9465-1469","authenticated-orcid":false,"given":"Mengxin","family":"Zhu","sequence":"first","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-7792-516X","authenticated-orcid":false,"given":"Fangzhou","family":"Shi","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9284-1584","authenticated-orcid":false,"given":"Yuan","family":"Yan","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9546-8938","authenticated-orcid":false,"given":"Hongjie","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electrical Insulation and Power Equipment, School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Maintenance of HV cable systems","year":"2021"},{"key":"ref2","year":"2012","journal-title":"IEEE Guide for Field Testing and Evaluation of the Insulation of Shielded Power Cable Systems Rated 5 kV and Above"},{"key":"ref3","year":"2021","journal-title":"Power Cables With Extruded Insulation and Their Accessories for Rated Voltages From 1 kV (Um = 1.2 kV) up to 30 kV (Um = 36 kV)"},{"key":"ref4","year":"2020","journal-title":"Power Cables With Extruded Insulation and Their Accessories for Rated Voltages Above 30 kV (Um= 36 kV) up to 150 kV (Um = 170 kV)\u2014Test Methods and Requirements"},{"key":"ref5","year":"2013","journal-title":"IEEE Guide for Field Testing of Shielded Power Cable Systems Using Very Low Frequency (VLF) (Less than 1 Hz)"},{"key":"ref6","year":"2016","journal-title":"IEEE Guide for Field Testing of Shielded Power Cable Systems Rated 5 kV and Above With Damped Alternating Current (DAC) Voltage"},{"key":"ref7","article-title":"After laying tests on AC and DC cable systems with new technologies","year":"2021"},{"key":"ref8","year":"2015","journal-title":"High-Voltage Test Techniques\u2014Partial Discharge Measurements"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tdc-la.2008.4641829"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/icempe.2019.8727280"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2022.3157919"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4712673"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/57.833657"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2007.386481"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICATE.2012.6403471"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2603446"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.2965805"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2019.1334"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICONAT57137.2023.10080804"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3144077"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/0378-7796(95)01009-2"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2011.5871365"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3350134"},{"key":"ref24","first-page":"210","volume-title":"High-Voltage Testing Technology","author":"Chen","year":"2017"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2018.5597"},{"key":"ref26","article-title":"Datasheet FF450R33T3E3","year":"2023"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10836960\/10606956.pdf?arnumber=10606956","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,14]],"date-time":"2025-01-14T19:51:41Z","timestamp":1736884301000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10606956\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2]]},"references-count":26,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3423326","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,2]]}}}