{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T16:56:31Z","timestamp":1784998591859,"version":"3.55.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52320105009"],"award-info":[{"award-number":["52320105009"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52277051"],"award-info":[{"award-number":["52277051"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program","doi-asserted-by":"publisher","award":["2022YFB2502703"],"award-info":[{"award-number":["2022YFB2502703"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,4]]},"DOI":"10.1109\/tie.2024.3451059","type":"journal-article","created":{"date-parts":[[2024,9,16]],"date-time":"2024-09-16T17:57:47Z","timestamp":1726509467000},"page":"3313-3323","source":"Crossref","is-referenced-by-count":6,"title":["Multiple-Mode Antidisturbance Model Predictive Control of VLF-PMSM Sensorless Drive System With Double-Decoupling Position Search Observer"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6333-3329","authenticated-orcid":false,"given":"Xiaoyong","family":"Zhu","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-1569-5119","authenticated-orcid":false,"given":"Feixue","family":"Tan","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5308-8988","authenticated-orcid":false,"given":"Li","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3356-2889","authenticated-orcid":false,"given":"Wen-Hua","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-2474-785X","authenticated-orcid":false,"given":"Yican","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3241089"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3225228"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3363740"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2024.3404588"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2031183"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2818640"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3073311"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2089940"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.910524"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2024.3382678"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3007106"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3206703"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2814006"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2522977"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2901648"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3182820"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2835835"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3076718"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2018.8341362"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3053885"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3241177"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3110240"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3288145"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3094493"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3227272"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2818664"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3159962"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2020.2981422"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2947875"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3215457"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3068085"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2705245"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2023.3299652"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3363722"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3105392"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2518123"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10925470\/10680880.pdf?arnumber=10680880","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,14]],"date-time":"2025-03-14T17:49:50Z","timestamp":1741974590000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10680880\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4]]},"references-count":36,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3451059","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,4]]}}}