{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T17:38:51Z","timestamp":1775324331011,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010909","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52322702"],"award-info":[{"award-number":["52322702"]}],"id":[{"id":"10.13039\/501100010909","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100010909","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52207052"],"award-info":[{"award-number":["52207052"]}],"id":[{"id":"10.13039\/501100010909","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100010909","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52477044"],"award-info":[{"award-number":["52477044"]}],"id":[{"id":"10.13039\/501100010909","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Central Guidance on Local Science and Technology Development Fund of Hebei Province","award":["226Z1805G"],"award-info":[{"award-number":["226Z1805G"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,4]]},"DOI":"10.1109\/tie.2024.3453934","type":"journal-article","created":{"date-parts":[[2024,9,24]],"date-time":"2024-09-24T17:25:10Z","timestamp":1727198710000},"page":"3768-3777","source":"Crossref","is-referenced-by-count":35,"title":["A Reduced Current Ripple Overmodulation Strategy for Indirect Matrix Converter"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5993-8349","authenticated-orcid":false,"given":"Shanhu","family":"Li","sequence":"first","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-9022-1028","authenticated-orcid":false,"given":"Jin","family":"Zhou","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"given":"Feng","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Changsha University, Hunan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2465-647X","authenticated-orcid":false,"given":"Feng","family":"Niu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4346-1790","authenticated-orcid":false,"given":"Weitao","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Information Science & Engineering, Hunan Institute of Science and Technology, Hunan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2011.2159353"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/41.857968"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2023.3265046"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tvt.2019.2955218"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2640304"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3304295"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2835396"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2019.1600"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2959499"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3317232"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3302470"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3053895"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3313107"},{"issue":"5","key":"ref14","first-page":"1325","article-title":"Reducing switching losses in indirect matrix converter drives: Discontinuous PWM method","volume":"18","author":"Bak","year":"2018","journal-title":"J. Power Electron."},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2007557"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2988594"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2013.0740"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2185021"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2480382"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2604418"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3195615"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2710909"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2971084"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2054837"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10925470\/10691680.pdf?arnumber=10691680","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,14]],"date-time":"2025-03-14T17:50:28Z","timestamp":1741974628000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10691680\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4]]},"references-count":24,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3453934","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,4]]}}}