{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T16:03:40Z","timestamp":1781280220083,"version":"3.54.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,4]]},"DOI":"10.1109\/tie.2024.3454448","type":"journal-article","created":{"date-parts":[[2024,9,27]],"date-time":"2024-09-27T18:36:01Z","timestamp":1727462161000},"page":"3828-3839","source":"Crossref","is-referenced-by-count":5,"title":["Dual-Side Selective Harmonic Elimination Technique for Voltage Source Converters Interfacing DC Microgrids and AC Networks"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2192-4646","authenticated-orcid":false,"given":"Hein Wai","family":"Yan","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5527-9262","authenticated-orcid":false,"given":"Alain","family":"Sanchez-Ruiz","sequence":"additional","affiliation":[{"name":"Department of Electronic Technology, University of the Basque Country (UPV\/EHU), Vitoria-Gasteiz, Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1514-3851","authenticated-orcid":false,"given":"Gaowen","family":"Liang","sequence":"additional","affiliation":[{"name":"Energy Research Institute, Nanyang Technological University, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6837-8913","authenticated-orcid":false,"given":"Angel","family":"P\u00e9rez-Basante","sequence":"additional","affiliation":[{"name":"Tecnalia, Basque Research and Technology Alliance (BRTA), Parque Tecnol\u00f3gico de Bizkaia, Derio, Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6352-6873","authenticated-orcid":false,"given":"Salvador","family":"Ceballos","sequence":"additional","affiliation":[{"name":"Tecnalia, Basque Research and Technology Alliance (BRTA), Parque Tecnol\u00f3gico de Bizkaia, Derio, Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6156-1774","authenticated-orcid":false,"given":"Ezequiel","family":"Rodriguez","sequence":"additional","affiliation":[{"name":"Energy Research Institute, Nanyang Technological University, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2909-4437","authenticated-orcid":false,"given":"Glen G.","family":"Farivar","sequence":"additional","affiliation":[{"name":"University of Melbourne, Parkville, VIC, Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3114-781X","authenticated-orcid":false,"given":"Josep","family":"Pou","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2705914"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2021.3073370"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3333534"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2012.0146"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2996143"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2027556"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2876443"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/PEDES.2014.7041953"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.921203"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3237878"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTIE.2023.3245559"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3284711"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.1973.349908"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2563378"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2355226"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3327280"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.1992.254623"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2004.839556"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2005.869752"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2017.08.068"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-022-07980-1"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LPEL.2004.831157"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3322500"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3315305"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3348237"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3287482"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3126678"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2694357"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2946543"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEurope51680.2022.9901278"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2013.11.010"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2009.0306"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2217725"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/LPEL.2005.856713"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2666847"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10925470\/10697379.pdf?arnumber=10697379","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,15]],"date-time":"2025-03-15T04:57:32Z","timestamp":1742014652000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10697379\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4]]},"references-count":35,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3454448","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,4]]}}}