{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T17:47:04Z","timestamp":1776275224010,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T00:00:00Z","timestamp":1743465600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52125705"],"award-info":[{"award-number":["52125705"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52207203"],"award-info":[{"award-number":["52207203"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,4]]},"DOI":"10.1109\/tie.2024.3454465","type":"journal-article","created":{"date-parts":[[2024,10,1]],"date-time":"2024-10-01T17:26:47Z","timestamp":1727803607000},"page":"4218-4226","source":"Crossref","is-referenced-by-count":4,"title":["An Online Converter-Level Wear-Out Failure Mode Separation Method for Power Semiconductor Devices"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3886-9812","authenticated-orcid":false,"given":"Yingzhou","family":"Peng","sequence":"first","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kaichun","family":"Wang","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-6041-4699","authenticated-orcid":false,"given":"Xing","family":"Wei","sequence":"additional","affiliation":[{"name":"Department of Energy Technology, Aalborg University, Aalborg, Denmark"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1409-2722","authenticated-orcid":false,"given":"Zhikang","family":"Shuai","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Hunan University, Changsha, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5404-3140","authenticated-orcid":false,"given":"Huai","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Energy Technology, Aalborg University, Aalborg, Denmark"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2346485"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-874X(01)00094-4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2690500"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2196894"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2633578"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2013.6634390"},{"key":"ref7","first-page":"1","article-title":"Impact of solder fatigue on module lifetime in power cycling tests","volume-title":"Proc. 14th Eur. Conf. Power Electron. Appl.","author":"Scheuermann","year":"2011"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2015.2481564"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3009600"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2312335"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2251358"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2178433"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2745442"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2017.0168"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2397955"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3427662"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2879845"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2935985"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2750328"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3141034"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-93988-9"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3314738"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.24295\/CPSSTPEA.2023.00048"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3009934"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10925470\/10702352.pdf?arnumber=10702352","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,14]],"date-time":"2025-03-14T17:53:55Z","timestamp":1741974835000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10702352\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4]]},"references-count":24,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3454465","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,4]]}}}