{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T09:53:28Z","timestamp":1762509208585,"version":"3.40.4"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T00:00:00Z","timestamp":1746057600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T00:00:00Z","timestamp":1746057600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T00:00:00Z","timestamp":1746057600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62373219"],"award-info":[{"award-number":["62373219"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,5]]},"DOI":"10.1109\/tie.2024.3462995","type":"journal-article","created":{"date-parts":[[2024,10,4]],"date-time":"2024-10-04T17:35:50Z","timestamp":1728063350000},"page":"5452-5460","source":"Crossref","is-referenced-by-count":2,"title":["A Coil Short-Circuit Fault Diagnosis Method Based on Overvoltage of Electromagnetic Coil in Active Magnetic Bearing"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4023-0711","authenticated-orcid":false,"given":"Youjun","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Civil Engineering, Shandong University, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-6207-7668","authenticated-orcid":false,"given":"Qingyang","family":"Meng","sequence":"additional","affiliation":[{"name":"School of Civil Engineering, Shandong University, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-6664-0788","authenticated-orcid":false,"given":"Yige","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Civil Engineering, Shandong University, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-0833-8652","authenticated-orcid":false,"given":"Dengmin","family":"Lu","sequence":"additional","affiliation":[{"name":"Geotechnical and Structure Engineering Research Center, Shandong University, Jinan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3588-3478","authenticated-orcid":false,"given":"Hongyi","family":"Cao","sequence":"additional","affiliation":[{"name":"Geotechnical and Structure Engineering Research Center and the School of Civil Engineering, Shandong University, Jinan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3243263"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3222595"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3235775"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3181406"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3273258"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3159959"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3296704"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3167167"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3309415"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2876400"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3201309"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2021.3092397"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3274879"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3066917"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3285899"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2005.859834"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3167656"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/SYSTOL.2016.7739805"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.23919\/ICEMS52562.2021.9634621"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/SRSE59585.2023.10336087"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2933258"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2023.3301513"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3157395"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/10960388\/10705797.pdf?arnumber=10705797","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,10]],"date-time":"2025-04-10T17:14:39Z","timestamp":1744305279000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10705797\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5]]},"references-count":23,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3462995","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2025,5]]}}}