{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,23]],"date-time":"2025-06-23T14:06:39Z","timestamp":1750687599975,"version":"3.41.0"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006134","name":"Office of Energy Efficiency and Renewable Energy","doi-asserted-by":"publisher","award":["34019"],"award-info":[{"award-number":["34019"]}],"id":[{"id":"10.13039\/100006134","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100016818","name":"UT-Battelle","doi-asserted-by":"publisher","award":["DE-AC05-00OR22725"],"award-info":[{"award-number":["DE-AC05-00OR22725"]}],"id":[{"id":"10.13039\/100016818","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,7]]},"DOI":"10.1109\/tie.2024.3508054","type":"journal-article","created":{"date-parts":[[2024,12,19]],"date-time":"2024-12-19T19:24:34Z","timestamp":1734636274000},"page":"6943-6956","source":"Crossref","is-referenced-by-count":1,"title":["A Neural Network-Based Power Mismatch Elimination Strategy for Integrated Solar and ESS AC\/DC Systems (MARS)"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1753-8830","authenticated-orcid":false,"given":"Qianxue","family":"Xia","sequence":"first","affiliation":[{"name":"Georgia Institute of Technology, Atlanta, GA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9451-7294","authenticated-orcid":false,"given":"Suman","family":"Debnath","sequence":"additional","affiliation":[{"name":"Oak Ridge National Laboratory, Knoxville, TN, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8859-7339","authenticated-orcid":false,"given":"Maryam","family":"Saeedifard","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Georgia Institute of Technology, Atlanta, GA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2014.2305433"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2721878"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/en9121012"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2726583"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2020.3037520"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3014739"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2014.2342656"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2458038"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3050466"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3169887"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2015.7104468"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3100341"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICICM56102.2022.10011394"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE47101.2021.9595231"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3208594"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3021022"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3038064"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3076721"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3126815"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3163395"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3194974"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3351234"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3137544"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2819982"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/IECON43393.2020.9254446"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JPETS.2019.2892418"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2013.6646945"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3318565"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2024.3399395"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3404398"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3303654"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2594078"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2362879"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2022.9848440"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.23919\/IPEC.2018.8507476"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/APEX.2007.357500"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/LMAG.2013.2255864"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE47101.2021.9595731"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11022995\/10807791.pdf?arnumber=10807791","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,4]],"date-time":"2025-06-04T17:57:02Z","timestamp":1749059822000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10807791\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7]]},"references-count":38,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3508054","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2025,7]]}}}