{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T18:01:15Z","timestamp":1775325675548,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003246","name":"Dutch Research Council","doi-asserted-by":"crossref","award":["KICH1.KICH1.21.003"],"award-info":[{"award-number":["KICH1.KICH1.21.003"]}],"id":[{"id":"10.13039\/501100003246","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,7]]},"DOI":"10.1109\/tie.2024.3511086","type":"journal-article","created":{"date-parts":[[2024,12,12]],"date-time":"2024-12-12T19:13:52Z","timestamp":1734030832000},"page":"7005-7016","source":"Crossref","is-referenced-by-count":3,"title":["Partial-Range SOC-Insensitive Model With EIS Change Pattern Recognition Model for Battery Aging Estimation"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-0431-1556","authenticated-orcid":false,"given":"Zhansheng","family":"Ning","sequence":"first","affiliation":[{"name":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), University of Twente, Enschede, NB, The Netherlands"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6378-9625","authenticated-orcid":false,"given":"Junyun","family":"Deng","sequence":"additional","affiliation":[{"name":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), University of Twente, Enschede, NB, The Netherlands"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7405-1500","authenticated-orcid":false,"given":"Prasanth","family":"Venugopal","sequence":"additional","affiliation":[{"name":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), University of Twente, Enschede, NB, The Netherlands"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8361-9110","authenticated-orcid":false,"given":"Thiago Batista","family":"Soeiro","sequence":"additional","affiliation":[{"name":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), University of Twente, Enschede, NB, The Netherlands"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5239-4019","authenticated-orcid":false,"given":"Gert","family":"Rietveld","sequence":"additional","affiliation":[{"name":"Faculty of Electrical Engineering, Mathematics and Computer Science (EEMCS), University of Twente, Enschede, NB, The Netherlands"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3229350"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3199905"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3233676"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3379664"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2021.229860"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2686324"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2013.2293597"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3031185"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.isci.2023.106821"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-15235-7"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111795"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jechem.2022.09.045"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112597"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MetroXRAINE58569.2023.10405626"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/EPE23ECCEEurope58414.2023.10264480"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2022.119502"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2022.119516"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2021.118317"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3435455"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2021.122880"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2010.12.102"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2018.11.020"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2780184"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2022.106052"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2021.121227"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2019.101106"},{"key":"ref27","volume-title":"Libforsecuse data release - impedance spectra of life cycle tests of commercial 18650 cells, Zenodo","author":"Chan","year":"2022"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1149\/2.0721508jes"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S0013-4686(99)00402-8"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3160021"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ASRU46091.2019.9004025"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.21037\/atm.2016.03.37"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11022995\/10795472.pdf?arnumber=10795472","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,4]],"date-time":"2025-06-04T17:56:45Z","timestamp":1749059805000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10795472\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7]]},"references-count":32,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3511086","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,7]]}}}