{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,4]],"date-time":"2025-06-04T18:10:07Z","timestamp":1749060607813,"version":"3.41.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52177191"],"award-info":[{"award-number":["52177191"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,7]]},"DOI":"10.1109\/tie.2024.3515283","type":"journal-article","created":{"date-parts":[[2024,12,20]],"date-time":"2024-12-20T19:03:19Z","timestamp":1734721399000},"page":"7061-7071","source":"Crossref","is-referenced-by-count":0,"title":["A Dual DC-Bus Integrated DAB Converter With Voltage Match Control for Wide Voltage Range Applications"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-4355-2317","authenticated-orcid":false,"given":"Yu","family":"Chen","sequence":"first","affiliation":[{"name":"Hubei Key Laboratory of Power Equipment and System Security for Integrated Energy, School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9316-7798","authenticated-orcid":false,"given":"Shangzhi","family":"Pan","sequence":"additional","affiliation":[{"name":"Hubei Key Laboratory of Power Equipment and System Security for Integrated Energy, School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-0058-269X","authenticated-orcid":false,"given":"Zifan","family":"Li","sequence":"additional","affiliation":[{"name":"Hubei Key Laboratory of Power Equipment and System Security for Integrated Energy, School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0260-3692","authenticated-orcid":false,"given":"Zisen","family":"Lin","sequence":"additional","affiliation":[{"name":"Hubei Key Laboratory of Power Equipment and System Security for Integrated Energy, School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2306-7203","authenticated-orcid":false,"given":"Jinwu","family":"Gong","sequence":"additional","affiliation":[{"name":"Hubei Key Laboratory of Power Equipment and System Security for Integrated Energy, School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1102-891X","authenticated-orcid":false,"given":"Xiaoming","family":"Zha","sequence":"additional","affiliation":[{"name":"Hubei Key Laboratory of Power Equipment and System Security for Integrated Energy, School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2023.3285627"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2024.3355019"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2021.3128417"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2020.3019761"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2013.2289913"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2008.2005103"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/28.67533"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2014.2309853"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2010.2070519"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2021.3106130"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2016.2543182"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2746518"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2756601"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2011.2181421"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2013.2282306"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2015.2507787"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2023.3276517"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2678524"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2022.3221946"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2022.3208105"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2939301"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2021.3105872"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2019.2911331"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3060477"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/itec.2012.6243490"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11022995\/10811756.pdf?arnumber=10811756","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,4]],"date-time":"2025-06-04T17:57:02Z","timestamp":1749059822000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10811756\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7]]},"references-count":25,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2024.3515283","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2025,7]]}}}