{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,25]],"date-time":"2026-04-25T12:04:50Z","timestamp":1777118690562,"version":"3.51.4"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tie.2025.3532740","type":"journal-article","created":{"date-parts":[[2025,2,14]],"date-time":"2025-02-14T13:29:44Z","timestamp":1739539784000},"page":"9082-9094","source":"Crossref","is-referenced-by-count":8,"title":["Integrated Co-Simulation and Hardware-in-the-Loop Testing for Microgrid"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3490-1926","authenticated-orcid":false,"given":"Sonam","family":"Gupta","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Jammu, Jammu and Kashmir, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3977-7023","authenticated-orcid":false,"given":"Anup","family":"Shukla","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Jammu, Jammu and Kashmir, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4195-5079","authenticated-orcid":false,"given":"Mohammad","family":"Abusara","sequence":"additional","affiliation":[{"name":"University of Exeter, Exeter, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3349574"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2022.3161608"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2023.107811"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/NPEC57805.2023.10384988"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2018.5274"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2023.3236637"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3120478"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2960863"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2022.108012"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IECON51785.2023.10312024"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2019.2898115"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3287809"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3261863"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3361917"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3303463"},{"key":"ref16","first-page":"1","article-title":"A comparative analysis of SRF-PLL and EPLL for grid connected converter","volume-title":"Proc. 11th Nat. Power Electron. Conf. (NPEC)","author":"Gupta","year":"2023"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/electricity2030015"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2923641"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3246464"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3340202"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/GlobConPT57482.2022.9938276"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2969636"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2624259"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2798566"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2862893"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2022.3189529"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3308134"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.seta.2022.101961"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3413821"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11118989\/10887107.pdf?arnumber=10887107","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,7]],"date-time":"2025-08-07T17:44:59Z","timestamp":1754588699000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10887107\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":29,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3532740","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}