{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,10]],"date-time":"2026-04-10T16:30:15Z","timestamp":1775838615128,"version":"3.50.1"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100019600","name":"Hanoi University of Science and Technology","doi-asserted-by":"crossref","award":["T2023-TD-008"],"award-info":[{"award-number":["T2023-TD-008"]}],"id":[{"id":"10.13039\/100019600","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tie.2025.3536537","type":"journal-article","created":{"date-parts":[[2025,3,4]],"date-time":"2025-03-04T13:48:39Z","timestamp":1741096119000},"page":"9095-9105","source":"Crossref","is-referenced-by-count":4,"title":["Novel Shielding Method for Planar Transformers to Suppress Common-Mode EMI Noise and Improve Soft-Switching Range"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-1723-5897","authenticated-orcid":false,"given":"Khuong-Duy","family":"Le","sequence":"first","affiliation":[{"name":"Hanoi University of Science and Technology, Hanoi, Vietnam"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-1084-7380","authenticated-orcid":false,"given":"Quang-Huy","family":"Nguyen","sequence":"additional","affiliation":[{"name":"Hanoi University of Science and Technology, Hanoi, Vietnam"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-7621-6009","authenticated-orcid":false,"given":"Minh-Quan","family":"Nguyen","sequence":"additional","affiliation":[{"name":"Hanoi University of Science and Technology, Hanoi, Vietnam"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4244-4764","authenticated-orcid":false,"given":"Tat-Thang","family":"Le","sequence":"additional","affiliation":[{"name":"FPT Automotive, Frisco, TX, USA"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-1245-5100","authenticated-orcid":false,"given":"Trong-Nha","family":"Quang","sequence":"additional","affiliation":[{"name":"Astec America, Eden Prairie, MN, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2690-6305","authenticated-orcid":false,"given":"Duy-Dinh","family":"Nguyen","sequence":"additional","affiliation":[{"name":"Hanoi University of Science and Technology, Hanoi, Vietnam"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2023.3243807"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2020.3011166"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2022.3215623"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2023.3294637"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2733473"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2013.2260176"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/apec48139.2024.10509334"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2020.3002857"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2012.2224071"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2016.2602360"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2018.2874806"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2019.2952878"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2903168"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2020.3004168"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/apec48139.2024.10509045"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ecce.2014.6954054"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2679717"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/pesc.2008.4592084"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/apec43580.2023.10131601"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2018.2850351"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2022.3190931"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/apec.2014.6803365"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/apec.2016.7468390"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2014.2387335"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2020.0847"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2024.3432890"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2018.2803761"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2024.3386654"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/access.2019.2902462"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/peas53589.2021.9628502"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/temc.2017.2777258"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2021.3058234"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ecce.2016.7854813"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2650952"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11118989\/10909706.pdf?arnumber=10909706","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T18:02:18Z","timestamp":1761847338000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10909706\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":34,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3536537","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}