{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,10]],"date-time":"2026-06-10T01:24:03Z","timestamp":1781054643045,"version":"3.54.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473282"],"award-info":[{"award-number":["62473282"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62303349"],"award-info":[{"award-number":["62303349"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62203326"],"award-info":[{"award-number":["62203326"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100006606","name":"Tianjin Natural Science Foundation","doi-asserted-by":"publisher","award":["20JCYBJC00180"],"award-info":[{"award-number":["20JCYBJC00180"]}],"id":[{"id":"10.13039\/501100006606","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tie.2025.3546323","type":"journal-article","created":{"date-parts":[[2025,3,12]],"date-time":"2025-03-12T13:43:35Z","timestamp":1741787015000},"page":"9354-9366","source":"Crossref","is-referenced-by-count":5,"title":["Lateral Control for UGVs by ADRC With Modeling Compensation and Expanded Disturbance Observation"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-3903-8540","authenticated-orcid":false,"given":"Chenyang","family":"Zhao","sequence":"first","affiliation":[{"name":"School of Control Science and Engineering, and Tianjin Key Laboratory of Autonomous Intelligence Technology and Systems, Tiangong University, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8390-3907","authenticated-orcid":false,"given":"Baoquan","family":"Li","sequence":"additional","affiliation":[{"name":"School of Control Science and Engineering, and Tianjin Key Laboratory of Autonomous Intelligence Technology and Systems, Tiangong University, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-6389-0352","authenticated-orcid":false,"given":"Changfu","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Control Science and Engineering, and Tianjin Key Laboratory of Autonomous Intelligence Technology and Systems, Tiangong University, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8303-2758","authenticated-orcid":false,"given":"Wuxi","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Control Science and Engineering, and Tianjin Key Laboratory of Autonomous Intelligence Technology and Systems, Tiangong University, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5308-6539","authenticated-orcid":false,"given":"Xuebo","family":"Zhang","sequence":"additional","affiliation":[{"name":"Institute of Robotics and Automatic Information Systems, and Tianjin Key Laboratory of Intelligent Robotics, Nankai University, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2017.2705249"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.3010887"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3176638"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.3013288"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2022.3208245"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2019.103068"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2016.2603528"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2021.3102479"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2019.2915376"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2019.2892926"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2021.3130225"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIV.2019.2904385"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2941379"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.oceaneng.2016.06.041"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2907696"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2023.3255586"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2869573"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3068672"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3026336"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2992951"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2897545"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3191999"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3426047"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2711538"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2022.09.019"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3172756"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2021.3127794"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2022.3151834"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3086273"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2531021"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2916982"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2903752"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1972.1100142"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2019.2892489"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1002\/rnc.3972"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11118989\/10924204.pdf?arnumber=10924204","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,7]],"date-time":"2025-08-07T17:44:47Z","timestamp":1754588687000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10924204\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":35,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3546323","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}