{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T15:06:45Z","timestamp":1784300805600,"version":"3.55.0"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52207063"],"award-info":[{"award-number":["52207063"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52277176"],"award-info":[{"award-number":["52277176"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,10]]},"DOI":"10.1109\/tie.2025.3549109","type":"journal-article","created":{"date-parts":[[2025,3,21]],"date-time":"2025-03-21T20:38:05Z","timestamp":1742589485000},"page":"10130-10140","source":"Crossref","is-referenced-by-count":9,"title":["Fast Active Power Recovery for Grid-Forming Converter During Postfault Under Different R\/X Ratios of Grid Impedance"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0181-4738","authenticated-orcid":false,"given":"Chao","family":"Wu","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Shanghai Jiaotong University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-0525-6913","authenticated-orcid":false,"given":"Zhaoyue","family":"Zou","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Shanghai Jiaotong University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4445-0073","authenticated-orcid":false,"given":"Xiaoling","family":"Xiong","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, North China Electric Power University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3178-5413","authenticated-orcid":false,"given":"Yong","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Shanghai Jiaotong University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8311-7412","authenticated-orcid":false,"given":"Frede","family":"Blaabjerg","sequence":"additional","affiliation":[{"name":"AAU Energy, Aalborg University, Aalborg, Denmark"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2946310"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3047480"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2933628"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3052350"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/OJIA.2021.3074028"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/pesgm.2018.8586162"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2965152"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2018.2866122"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2976791"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2859384"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3046462"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3074027"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3122744"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3199906"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE50734.2022.9948159"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3164687"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2022.9762253"},{"key":"ref18","article-title":"Fast fault current injection specification text","volume":"GC0111","author":"Kay","year":"2020","journal-title":"Nat. Grid ESO"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE53617.2023.10362015"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/PESGM.2012.6344713"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3118677"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2931477"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3395781"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/NAPS61145.2024.10741670"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3017254"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2024.111180"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3082055"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2476702"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2017.2749259"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11163521\/10934800.pdf?arnumber=10934800","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,15]],"date-time":"2025-09-15T17:37:34Z","timestamp":1757957854000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10934800\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10]]},"references-count":29,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3549109","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,10]]}}}