{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,26]],"date-time":"2026-07-26T08:22:55Z","timestamp":1785054175959,"version":"3.55.0"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52477051"],"award-info":[{"award-number":["52477051"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,10]]},"DOI":"10.1109\/tie.2025.3552258","type":"journal-article","created":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T19:36:21Z","timestamp":1743449781000},"page":"9866-9875","source":"Crossref","is-referenced-by-count":8,"title":["Improved Model-Free Predictive Current Control for Suppressing Inverter Nonlinearity and Parametric Time-Varying of PMSM Drive Systems"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9451-3311","authenticated-orcid":false,"given":"Xiaodong","family":"Sun","sequence":"first","affiliation":[{"name":"Automotive Engineering Research Institute, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-7974-7145","authenticated-orcid":false,"given":"Zhihui","family":"Huang","sequence":"additional","affiliation":[{"name":"Automotive Engineering Research Institute, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5061-3313","authenticated-orcid":false,"given":"Zebin","family":"Yang","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8369-6802","authenticated-orcid":false,"given":"Gang","family":"Lei","sequence":"additional","affiliation":[{"name":"School of Electrical and Data Engineering, University of Technology Sydney, Sydney, Australia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3005-9543","authenticated-orcid":false,"given":"Teng","family":"Li","sequence":"additional","affiliation":[{"name":"Automotive Engineering Research Institute, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3157476"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3376581"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3190536"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2583412"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2004.836633"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3155243"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2437893"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3370622"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2559419"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3080220"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2020.3008828"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3145873"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3138905"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2690998"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3337498"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2022.105851"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2020.2975908"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2812833"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2758393"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2478397"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2895512"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2155010"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2494534"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3067328"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2835835"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2187912"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2592534"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011621"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2023.3332136"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2016.7474746"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3327554"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2253065"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3004567"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2970660"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3138922"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2252024"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1080\/00207179.2013.810345"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2003.1242516"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3235359"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11163521\/10944655.pdf?arnumber=10944655","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T18:02:19Z","timestamp":1761847339000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10944655\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10]]},"references-count":39,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3552258","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,10]]}}}