{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T16:54:50Z","timestamp":1778604890243,"version":"3.51.4"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52477054"],"award-info":[{"award-number":["52477054"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,10]]},"DOI":"10.1109\/tie.2025.3552263","type":"journal-article","created":{"date-parts":[[2025,3,28]],"date-time":"2025-03-28T23:32:28Z","timestamp":1743204748000},"page":"10487-10496","source":"Crossref","is-referenced-by-count":1,"title":["A Novel Magnetic Permeance Network Model for SPM Machine With Bread-Loaf Structure"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7919-4420","authenticated-orcid":false,"given":"Baocheng","family":"Guo","sequence":"first","affiliation":[{"name":"School of Electrical and Automation Engineering, Nanjing Normal University, Nanjing, Jiangsu Province, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-9788-5440","authenticated-orcid":false,"given":"Yanchen","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Electrical and Automation Engineering, Nanjing Normal University, Nanjing, Jiangsu Province, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6546-0313","authenticated-orcid":false,"given":"Fei","family":"Peng","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, Jiangsu Province, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3131872"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2934065"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.3005105"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2023.3292871"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2018.2842714"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2021.3118222"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.4998658"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2018.2879303"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/20.809140"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2021.3121438"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/pesc.2008.4592584"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2013.2252871"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2018.2884212"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2760862"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/pedes.2018.8707543"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2005.853376"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2022.3146547"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2021.3132885"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/20.996333"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2010.2043506"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2024.3428488"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.30941\/cestems.2023.00012"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/9781119352181"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11163521\/10944789.pdf?arnumber=10944789","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T18:02:16Z","timestamp":1761847336000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10944789\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10]]},"references-count":23,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3552263","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,10]]}}}