{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:28:12Z","timestamp":1783700892853,"version":"3.55.0"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T00:00:00Z","timestamp":1761955200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Ministry of Science and Technology of the People’s Republic of China","award":["2020YFA0711200"],"award-info":[{"award-number":["2020YFA0711200"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473113"],"award-info":[{"award-number":["62473113"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Open Fund of Science and Technology on Thermal Energy and Power Laboratory","award":["TPL2021C01"],"award-info":[{"award-number":["TPL2021C01"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,11]]},"DOI":"10.1109\/tie.2025.3558029","type":"journal-article","created":{"date-parts":[[2025,4,29]],"date-time":"2025-04-29T13:31:45Z","timestamp":1745933505000},"page":"11919-11929","source":"Crossref","is-referenced-by-count":4,"title":["A Robust Integrated Estimation of Unknown Disturbances, Parameters and States for Linear Time-Varying Systems"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-4433-8716","authenticated-orcid":false,"given":"Xiaoyi","family":"Xu","sequence":"first","affiliation":[{"name":"Control and Simulation Center, Harbin Institute of Technology, Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2143-2438","authenticated-orcid":false,"given":"Hao","family":"Luo","sequence":"additional","affiliation":[{"name":"Control and Simulation Center, Harbin Institute of Technology, Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8131-2967","authenticated-orcid":false,"given":"Mingyi","family":"Huo","sequence":"additional","affiliation":[{"name":"School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3918-7039","authenticated-orcid":false,"given":"Yuchen","family":"Jiang","sequence":"additional","affiliation":[{"name":"Control and Simulation Center, Harbin Institute of Technology, Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3860-9105","authenticated-orcid":false,"given":"Xiao","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-6848-0982","authenticated-orcid":false,"given":"Xin","family":"Lv","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2020.104560"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3314912"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-020-3192-5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2478397"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3329201"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2013.05.017"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2007.4282421"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/s19194174"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.oceaneng.2022.111169"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2024.105853"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1023\/B:AURC.0000044264.74470.48"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2021.3093330"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011621"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2024.3488794"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2023.02.020"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2023.3290564"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3182\/20090630-4-ES-2003.00155"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/9.989154"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-658-15928-3"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1971.1099826"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/S0076-5392(09)60368-4"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S1474-6670(17)35006-1"},{"key":"ref23","volume-title":"Adaptive Control","author":"Astrom","year":"1989"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2017.7510679"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11199974\/10980046.pdf?arnumber=10980046","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,30]],"date-time":"2025-10-30T18:02:24Z","timestamp":1761847344000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10980046\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,11]]},"references-count":24,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3558029","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,11]]}}}