{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,26]],"date-time":"2026-06-26T14:55:59Z","timestamp":1782485759350,"version":"3.54.5"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52477013"],"award-info":[{"award-number":["52477013"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Lingang Laboratory","award":["LG-GG-202402-06-10"],"award-info":[{"award-number":["LG-GG-202402-06-10"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3566720","type":"journal-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T13:40:15Z","timestamp":1747834815000},"page":"12666-12674","source":"Crossref","is-referenced-by-count":1,"title":["Low-Radiation Multiple-Coil Wireless Charger Using Detuned Compensation"],"prefix":"10.1109","volume":"72","author":[{"given":"Heyuan","family":"Li","sequence":"first","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiaoxuan","family":"Ji","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xufeng","family":"Kou","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2124-3453","authenticated-orcid":false,"given":"Haoyu","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1642-6626","authenticated-orcid":false,"given":"Minfan","family":"Fu","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, ShanghaiTech University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2944845"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3305476"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3262245"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880667"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2823782"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2019.2929143"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3013522"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3222593"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3212386"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JESTIE.2023.3237498"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3176896"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3257827"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3038081"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3216635"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3299930"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2022.3174924"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2020.2983145"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3217592"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2014.6894883"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3141607"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2973465"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2768031"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2015.2398865"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2851988"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2020.2988463"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3404143"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JESTIE.2023.3340100"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2833209"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3294484"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3064373"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3414343"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3153820"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2021.3137527"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11008682.pdf?arnumber=11008682","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:41:08Z","timestamp":1765219268000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11008682\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":33,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3566720","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}