{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T15:30:07Z","timestamp":1780500607086,"version":"3.54.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52025073"],"award-info":[{"award-number":["52025073"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52377055"],"award-info":[{"award-number":["52377055"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Aeronautical Science Foundation of China","award":["202200580R3001"],"award-info":[{"award-number":["202200580R3001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3566734","type":"journal-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T13:40:15Z","timestamp":1747834815000},"page":"12173-12184","source":"Crossref","is-referenced-by-count":3,"title":["Modular Winding Configuration Investigation of Dual Three-Phase PM Machine Having Short-Circuit Fault Tolerance Capability"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4444-6595","authenticated-orcid":false,"given":"Wenxiang","family":"Zhao","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-8654-0650","authenticated-orcid":false,"given":"Jie","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7741-9630","authenticated-orcid":false,"given":"Xiaopeng","family":"Zhao","sequence":"additional","affiliation":[{"name":"AVIC Xi’an Flight Automatic Control Research Institute, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3069-6929","authenticated-orcid":false,"given":"Jinghua","family":"Ji","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7071-797X","authenticated-orcid":false,"given":"Yuhua","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3281708"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2019.2956355"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/cjee.2024.000083"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/machines10030208"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3262876"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/CJEE.2024.000066"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3292406"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2004.832074"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2070782"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2282604"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2917031"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2020.3007394"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2020.3004161"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3050359"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2664718"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3059546"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2748035"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2019.0611"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2918190"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.2988086"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3165667"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3227621"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3219067"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3346835"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2002.804805"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3111752"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2024.3360050"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2188138"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2304933"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3130334"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2025.3552422"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3310036"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2024.3385010"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11008684.pdf?arnumber=11008684","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:41:27Z","timestamp":1765219287000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11008684\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":33,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3566734","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}