{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,21]],"date-time":"2026-01-21T17:23:30Z","timestamp":1769016210468,"version":"3.49.0"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100019014","name":"Chengdu Municipal Science and Technology Program","doi-asserted-by":"publisher","award":["2024-YF05-00673-SN"],"award-info":[{"award-number":["2024-YF05-00673-SN"]}],"id":[{"id":"10.13039\/501100019014","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52077183"],"award-info":[{"award-number":["52077183"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52207138"],"award-info":[{"award-number":["52207138"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3567655","type":"journal-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T13:40:15Z","timestamp":1747834815000},"page":"12987-12998","source":"Crossref","is-referenced-by-count":1,"title":["A Single-Phase Five-Switch Boost Nonisolated Bidirectional DC\u2013AC Converter With Low Leakage Current and Continuous Input\/Output Currents"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7095-1261","authenticated-orcid":false,"given":"Jiangpeng","family":"Yang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-8603-3450","authenticated-orcid":false,"given":"Hengpeng","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-5180-5113","authenticated-orcid":false,"given":"Fanglin","family":"Bai","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-0947-2592","authenticated-orcid":false,"given":"Hao","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1610-4804","authenticated-orcid":false,"given":"Yue","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-6177-2393","authenticated-orcid":false,"given":"Hechi","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7717-8152","authenticated-orcid":false,"given":"Zeliang","family":"Shu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and the Key Laboratory of Magnetic Suspension Technology and Maglev Vehicle, Ministry of Education, Southwest Jiaotong University, Chengdu, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2018.2820507"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3323219"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3007117"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2221482"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2024.3401463"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3324871"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3437229"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3486923"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3234070"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3166805"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3179784"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3232655"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2897543"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3349575"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3121365"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3026275"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3161825"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3503515"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2981552"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3458191"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2918349"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3016867"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3218634"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3218272"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3180287"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3163762"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2292609"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3347840"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11008681.pdf?arnumber=11008681","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:41:52Z","timestamp":1765219312000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11008681\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":28,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3567655","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}