{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,5]],"date-time":"2026-05-05T15:53:18Z","timestamp":1777996398757,"version":"3.51.4"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key R&D Program of China","award":["2023YFB2407500"],"award-info":[{"award-number":["2023YFB2407500"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3569890","type":"journal-article","created":{"date-parts":[[2025,5,30]],"date-time":"2025-05-30T13:46:32Z","timestamp":1748612792000},"page":"13032-13043","source":"Crossref","is-referenced-by-count":3,"title":["A Control Method for Improving Power Quality of Parallel Three-Level Rectifiers Under Unbalanced Grid Voltage Conditions"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4983-4877","authenticated-orcid":false,"given":"Xue","family":"Zhang","sequence":"first","affiliation":[{"name":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9258-9152","authenticated-orcid":false,"given":"Wei","family":"Pei","sequence":"additional","affiliation":[{"name":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3738-0532","authenticated-orcid":false,"given":"Wei","family":"Deng","sequence":"additional","affiliation":[{"name":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3205897"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3074957"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3107618"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2796093"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3053216"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3331548"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2798613"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2908600"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2309634"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2840110"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2910790"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2968947"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3219128"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2786234"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3277192"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3295351"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2022.3146776"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2347914"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3093500"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.3048434"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2816742"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2930570"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2577560"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2877955"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2813390"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2923379"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2036674"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2041738"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2017.2722005"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2723866"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3326307"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2081952"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11018620.pdf?arnumber=11018620","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:40:41Z","timestamp":1765219241000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11018620\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":32,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3569890","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}