{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T17:53:33Z","timestamp":1775325213985,"version":"3.50.1"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51977036"],"award-info":[{"award-number":["51977036"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Postgraduate Research & Practice Innovation Program of Jiangsu Province","award":["SJCX24_0077"],"award-info":[{"award-number":["SJCX24_0077"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3572977","type":"journal-article","created":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T13:38:40Z","timestamp":1750253920000},"page":"12309-12320","source":"Crossref","is-referenced-by-count":2,"title":["Current Residual Double Normalization Fault Diagnosis Method for Interturn Short-Circuit Fault of PMSM Servo System"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7888-5959","authenticated-orcid":false,"given":"Yao","family":"Rao","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5330-8189","authenticated-orcid":false,"given":"Wei","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-6474-8984","authenticated-orcid":false,"given":"Jie","family":"Fu","sequence":"additional","affiliation":[{"name":"Innovation Center for Control Actuators, Beijing Institute of Precision Mechatronics and Controls, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2319-535X","authenticated-orcid":false,"given":"Peijuan","family":"Cui","sequence":"additional","affiliation":[{"name":"Innovation Center for Control Actuators, Beijing Institute of Precision Mechatronics and Controls, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-5396-9165","authenticated-orcid":false,"given":"Zaiping","family":"Zheng","sequence":"additional","affiliation":[{"name":"Innovation Center for Control Actuators, Beijing Institute of Precision Mechatronics and Controls, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3519592"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3511085"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.23919\/CJEE.2023.000048"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2015.0020"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3229357"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3398802"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3238167"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2020.2991271"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2677355"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3207181"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2023.3274052"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2978690"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2496900"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3352077"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2688973"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3109514"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2953269"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2318207"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICEM49940.2020.9271050"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2965500"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3217590"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11040066.pdf?arnumber=11040066","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:40:34Z","timestamp":1765219234000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11040066\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":21,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3572977","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}