{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T18:07:12Z","timestamp":1772302032864,"version":"3.50.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62173077"],"award-info":[{"award-number":["62173077"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62373092"],"award-info":[{"award-number":["62373092"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Key Research and Development Program of China","award":["2024YFB3309700"],"award-info":[{"award-number":["2024YFB3309700"]}]},{"name":"National Key Research and Development Program of China","award":["2024YFB3309701"],"award-info":[{"award-number":["2024YFB3309701"]}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["N2403020"],"award-info":[{"award-number":["N2403020"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3572979","type":"journal-article","created":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T13:38:40Z","timestamp":1750253920000},"page":"13972-13980","source":"Crossref","is-referenced-by-count":1,"title":["Development of a Modular Broad Learning System Model for Dynamic Hysteresis Effects"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3858-1694","authenticated-orcid":false,"given":"Hongzhi","family":"Xu","sequence":"first","affiliation":[{"name":"State Key Laboratory of Synthetical Automation for Process Industries, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-6140-9884","authenticated-orcid":false,"given":"Guoqiang","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Synthetical Automation for Process Industries, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7560-9764","authenticated-orcid":false,"given":"Ying","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering and Automation, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4848-9004","authenticated-orcid":false,"given":"Xiuyu","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Automation Engineering, Northeast Electric Power University, Jilin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9057-9623","authenticated-orcid":false,"given":"Zhi","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Synthetical Automation for Process Industries, Northeastern University, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3032922"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3173619"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3163553"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202300047"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3187583"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3314891"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2023.157442"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2206339"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2024.3494596"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2022.3231261"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2010.02.020"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3063976"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2003.11.007"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2021.3085321"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3065721"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2022.3144769"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3309233"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2017.2716952"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2021.3061094"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2863020"},{"key":"ref21","first-page":"1536","article-title":"Spatio-temporal broad learning networks for traffic speed prediction","volume-title":"Proc. 12th Asian Control Conf. (ASCC)","author":"Cui","year":"2019"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2020.3046019"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2023.3234381"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2005.844708"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2018.2805761"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3279948"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICARM49381.2020.9195369"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11040065.pdf?arnumber=11040065","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:42:00Z","timestamp":1765219320000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11040065\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":27,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3572979","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}