{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T12:34:44Z","timestamp":1775478884925,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2024YFB4709701"],"award-info":[{"award-number":["2024YFB4709701"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62203139"],"award-info":[{"award-number":["62203139"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100021171","name":"Basic and Applied Basic Research Foundation of Guangdong Province","doi-asserted-by":"publisher","award":["2023A1515011371"],"award-info":[{"award-number":["2023A1515011371"]}],"id":[{"id":"10.13039\/501100021171","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100021171","name":"Basic and Applied Basic Research Foundation of Guangdong Province","doi-asserted-by":"publisher","award":["2024A1515012417"],"award-info":[{"award-number":["2024A1515012417"]}],"id":[{"id":"10.13039\/501100021171","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shenzhen Natural Science Fund","award":["GXWD20220811151813005"],"award-info":[{"award-number":["GXWD20220811151813005"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3577304","type":"journal-article","created":{"date-parts":[[2025,7,10]],"date-time":"2025-07-10T17:47:55Z","timestamp":1752169675000},"page":"13141-13150","source":"Crossref","is-referenced-by-count":2,"title":["An Online Model-Based Diagnosis Method for Micro-Short Circuits in Series-Connected Lithium-Ion Battery Packs"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-4580-5174","authenticated-orcid":false,"given":"Fukang","family":"Shen","sequence":"first","affiliation":[{"name":"School of Intelligent Science and Engineering, Harbin Institute of Technology Shenzhen, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0757-8580","authenticated-orcid":false,"given":"Guangzhong","family":"Dong","sequence":"additional","affiliation":[{"name":"School of Intelligent Science and Engineering, Harbin Institute of Technology Shenzhen, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-9883-0693","authenticated-orcid":false,"given":"Zhipeng","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Intelligent Science and Engineering, Harbin Institute of Technology Shenzhen, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8866-7875","authenticated-orcid":false,"given":"Li","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Intelligent Science and Engineering, Harbin Institute of Technology Shenzhen, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8203-7795","authenticated-orcid":false,"given":"Yunjiang","family":"Lou","sequence":"additional","affiliation":[{"name":"School of Intelligent Science and Engineering, Harbin Institute of Technology Shenzhen, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3398687"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2020.3032201"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2024.124539"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2012.02.038"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.joule.2023.11.016"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10111309"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.advengsoft.2014.02.005"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2018.01.015"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3068553"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.06.087"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2021.123082"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.etran.2022.100172"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2023.232824"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2023.3234770"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2021.103732"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838109"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1080\/15435075.2024.2310007"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2020.101658"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2018.10.160"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2024.124722"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s42154-020-00127-9"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2019.101085"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2022.231516"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2020.101250"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984441"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2003.816754"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3497053"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2010.09.048"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2424673"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2016.2542115"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1049\/iet-est.2019.0026"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11077731.pdf?arnumber=11077731","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:41:25Z","timestamp":1765219285000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11077731\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":31,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3577304","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}