{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T21:15:28Z","timestamp":1765228528419,"version":"3.46.0"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Science Fund for Distinguished Young Scholars","award":["62525402"],"award-info":[{"award-number":["62525402"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62404164"],"award-info":[{"award-number":["62404164"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Key Research and Development Program of China","award":["2022YFB3604203","2021YFB3601102"],"award-info":[{"award-number":["2022YFB3604203","2021YFB3601102"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3577322","type":"journal-article","created":{"date-parts":[[2025,7,25]],"date-time":"2025-07-25T17:56:51Z","timestamp":1753466211000},"page":"13164-13175","source":"Crossref","is-referenced-by-count":0,"title":["Symmetrical GaN-Based Vertical Module With Low Interference Integration and High Thermal Performance for PoL Converters"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3548-3044","authenticated-orcid":false,"given":"Longyang","family":"Yu","sequence":"first","affiliation":[{"name":"School of Microelectronics, National Key Laboratory of Wide Bandgap Semiconductor Devices and Integrated Technology, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1406-1088","authenticated-orcid":false,"given":"Shenglei","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Microelectronics, National Key Laboratory of Wide Bandgap Semiconductor Devices and Integrated Technology, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-4591-1956","authenticated-orcid":false,"given":"Xuejing","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Microelectronics, National Key Laboratory of Wide Bandgap Semiconductor Devices and Integrated Technology, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6582-5551","authenticated-orcid":false,"given":"Wei","family":"Mu","sequence":"additional","affiliation":[{"name":"Department of Engineering, University of Cambridge, Cambridge, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4077-3967","authenticated-orcid":false,"given":"Xiufeng","family":"Song","sequence":"additional","affiliation":[{"name":"School of Microelectronics, National Key Laboratory of Wide Bandgap Semiconductor Devices and Integrated Technology, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5935-3976","authenticated-orcid":false,"given":"Shuzhen","family":"You","sequence":"additional","affiliation":[{"name":"School of Microelectronics, National Key Laboratory of Wide Bandgap Semiconductor Devices and Integrated Technology, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8081-2919","authenticated-orcid":false,"given":"Yue","family":"Hao","sequence":"additional","affiliation":[{"name":"School of Microelectronics, National Key Laboratory of Wide Bandgap Semiconductor Devices and Integrated Technology, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7332-6704","authenticated-orcid":false,"given":"Jincheng","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, National Key Laboratory of Wide Bandgap Semiconductor Devices and Integrated Technology, Xidian University, Xi’an, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3128694"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3266365"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2320857"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3294471"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2238954"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3293022"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2048830"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2745686"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2646702"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3194133"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3204727"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2933595"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3236152"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3135386"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/APEC48139.2024.10509267"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/APEC48139.2024.10509453"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE47101.2021.9594973"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2826920"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11096979.pdf?arnumber=11096979","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:41:46Z","timestamp":1765219306000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11096979\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":18,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3577322","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}