{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T21:15:56Z","timestamp":1765228556126,"version":"3.46.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52077164"],"award-info":[{"award-number":["52077164"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3579063","type":"journal-article","created":{"date-parts":[[2025,7,9]],"date-time":"2025-07-09T23:18:52Z","timestamp":1752103132000},"page":"12424-12435","source":"Crossref","is-referenced-by-count":0,"title":["Phase Current Reconstruction Scheme of SRM Drives Based on Interleaved Pulse Injection Using Single DC-Link Current Sensor"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-0083-3752","authenticated-orcid":false,"given":"Dexu","family":"Lv","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5476-5218","authenticated-orcid":false,"given":"Wen","family":"Ding","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0810-0164","authenticated-orcid":false,"given":"Shuo","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electrical and Power Engineering, China University of Mining and Technology, Xuzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4574-1692","authenticated-orcid":false,"given":"Jun","family":"Cai","sequence":"additional","affiliation":[{"name":"C-MEIC, CICAEET, School of Automation, Nanjing University of Information Science and Technology, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8578-821X","authenticated-orcid":false,"given":"Zhonggang","family":"Yin","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Xi’an University of Technology, Xi’an, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1987.1104616"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/63.484420"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IECON43393.2020.9254502"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2711574"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3333056"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3091918"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3343732"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3183171"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICECET61485.2024.10698121"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2912764"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2505706"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/APEC42165.2021.9487250"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3196329"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2364153"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2016.2592981"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/ICEMS52562.2021.9634469"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2721898"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2782562"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2772152"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2830308"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2875667"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2020.3017864"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2022.3217693"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3455259"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/SCEMS52239.2021.9646094"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2904433"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3266596"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2019.8922469"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2022.3187693"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2955404"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11075736.pdf?arnumber=11075736","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:40:50Z","timestamp":1765219250000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11075736\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":30,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3579063","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}