{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,24]],"date-time":"2026-04-24T06:16:20Z","timestamp":1777011380610,"version":"3.51.4"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,1]]},"DOI":"10.1109\/tie.2025.3579108","type":"journal-article","created":{"date-parts":[[2025,8,12]],"date-time":"2025-08-12T18:01:59Z","timestamp":1755021719000},"page":"94-105","source":"Crossref","is-referenced-by-count":9,"title":["Time-Frequency Domain Lightweight Dual-Branch MSCFormer for PMSM ITSC Fault Diagnosis"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6237-0179","authenticated-orcid":false,"given":"Hao","family":"Yu","sequence":"first","affiliation":[{"name":"Agile Tomography Group, School of Engineering, Institute for Imaging, Data and Communications, The University of Edinburgh, Edinburgh, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0203-7467","authenticated-orcid":false,"given":"Shaobin","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8303-2072","authenticated-orcid":false,"given":"Yongxiang","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8054-9287","authenticated-orcid":false,"given":"Zihao","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-4915-2052","authenticated-orcid":false,"given":"Haoyi","family":"Mu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-1398-2360","authenticated-orcid":false,"given":"Wei","family":"Han","sequence":"additional","affiliation":[{"name":"Agile Tomography Group, School of Engineering, Institute for Imaging, Data and Communications, The University of Edinburgh, Edinburgh, U.K."}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2777408"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2160514"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3092198"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3180153"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2496900"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2018.2819627"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2024.3480971"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2953269"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2391186"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2581139"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2318207"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3213512"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3478840"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3318696"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/OJIES.2024.3350443"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2022.3169173"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2661846"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3207181"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.119998"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2941868"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.physd.2019.132306"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2022.12.006"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.aiopen.2022.10.001"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1038\/323533a0"},{"key":"ref26","article-title":"Layer normalization","author":"Ba","year":"2016"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3199985"},{"key":"ref28","article-title":"MobileNets: Efficient convolutional neural networks for mobile vision applications","author":"Howard","year":"2017"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3329245"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108774"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11318836\/11123528.pdf?arnumber=11123528","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T18:44:35Z","timestamp":1767206675000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11123528\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":31,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3579108","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,1]]}}}