{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T21:14:50Z","timestamp":1765228490375,"version":"3.46.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62471496","62071496","62061008"],"award-info":[{"award-number":["62471496","62071496","62061008"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Innovation Project of Graduate of Central South University, China","award":["2025ZZTS0610"],"award-info":[{"award-number":["2025ZZTS0610"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3581189","type":"journal-article","created":{"date-parts":[[2025,7,15]],"date-time":"2025-07-15T17:42:23Z","timestamp":1752601343000},"page":"14533-14542","source":"Crossref","is-referenced-by-count":2,"title":["An Anti-Degradation Chaotic Map and Its Statistical Robustness Analysis"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-3421-321X","authenticated-orcid":false,"given":"Jin","family":"Liu","sequence":"first","affiliation":[{"name":"School of Physics, Central South University, Changsha, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2503-9262","authenticated-orcid":false,"given":"Kehui","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Physics, Central South University, Changsha, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8660-2795","authenticated-orcid":false,"given":"Huihai","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Information, Central South University, Changsha, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5549-8510","authenticated-orcid":false,"given":"Wenhao","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Physics, Central South University, Changsha, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2018.2812080"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/1898998"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/fractalfract7120887"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3368470"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3279371"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3174288"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.5094936"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2024.05.022"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3337145"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2024.123190"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3235457"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3264101"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2020.12.065"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/math11112585"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3283877"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.matcom.2024.01.023"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-023-08853-5"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1142\/S0217979204025798"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1142\/S0218127423500487"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1142\/S0218127422500948"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.21468\/SciPostPhys.15.1.022"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-024-09530-x"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2717943"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1364\/OE.499634"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s11831-022-09824-6"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/5.0219361"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1038\/s41567-021-01230-2"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.spl.2020.108924"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.88.174102"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1142\/S0218127422500675"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3378448"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2021.3096388"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2023.03.038"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.110.014204"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2024.3506567"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3511675"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11080665.pdf?arnumber=11080665","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:41:06Z","timestamp":1765219266000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11080665\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":36,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3581189","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}