{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T21:14:55Z","timestamp":1765228495710,"version":"3.46.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52337002"],"award-info":[{"award-number":["52337002"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/tie.2025.3582682","type":"journal-article","created":{"date-parts":[[2025,7,23]],"date-time":"2025-07-23T18:43:19Z","timestamp":1753296199000},"page":"12544-12555","source":"Crossref","is-referenced-by-count":2,"title":["Eccentricity Diagnosis of Electric Machines Using Harmonic Ratio-Based Indices From Resolvers"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0463-7653","authenticated-orcid":false,"given":"Jiayue","family":"Zhou","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7877-778X","authenticated-orcid":false,"given":"Zechuan","family":"Lin","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Maynooth University, Maynooth, Kildare, Ireland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6921-0669","authenticated-orcid":false,"given":"Xi","family":"Xiao","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2020.3046112"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2018.2852732"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2008.922768"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2014.2307013"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2017.2726011"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2006.885131"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2021.3098669"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/icems59686.2023.10344495"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/en14144296"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2020.2996011"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2905832"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2015.2443711"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2003.811741"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/isie.2011.5984490"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/41.873206"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3229391"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tvt.2019.2909096"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3213909"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/jestie.2024.3514817"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3454475"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/pedstc57673.2023.10087148"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/icsens.2010.5689869"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/cefc61729.2024.10585862"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.3019260"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3130318"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3298404"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/icemd60816.2023.10429226"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.30420\/566262371"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2024.3355236"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2020.3001655"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2019.2955410"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2002.804805"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2012.2221131"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11281494\/11091591.pdf?arnumber=11091591","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T18:41:08Z","timestamp":1765219268000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11091591\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":33,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3582682","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}