{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,8]],"date-time":"2026-05-08T01:52:19Z","timestamp":1778205139297,"version":"3.51.4"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U2166216"],"award-info":[{"award-number":["U2166216"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai Pujiang Talent Program","award":["23PJ1405300"],"award-info":[{"award-number":["23PJ1405300"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,1]]},"DOI":"10.1109\/tie.2025.3585029","type":"journal-article","created":{"date-parts":[[2025,9,9]],"date-time":"2025-09-09T17:32:03Z","timestamp":1757439123000},"page":"522-533","source":"Crossref","is-referenced-by-count":24,"title":["Dynamic Circuit-Based Unified Power Regulation for Hybrid AC\/DC\/DS Microgrids: A Comprehensive Approach to Static and Transient Control"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5557-1036","authenticated-orcid":false,"given":"Pengfeng","family":"Lin","sequence":"first","affiliation":[{"name":"Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-5167-3075","authenticated-orcid":false,"given":"Qingzuo","family":"Meng","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7947-5230","authenticated-orcid":false,"given":"Miao","family":"Zhu","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7914-1209","authenticated-orcid":false,"given":"Amer M. Y. M.","family":"Ghias","sequence":"additional","affiliation":[{"name":"Nanyang Technological University, Singapore"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8311-7412","authenticated-orcid":false,"given":"Frede","family":"Blaabjerg","sequence":"additional","affiliation":[{"name":"Aalborg University, Aalborg, Denmark"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2006.881997"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2013.2286563"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tsg.2022.3216853"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2012.2214792"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2013.2252319"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tsg.2018.2890420"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2017.2696979"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MPAE.2003.1213534"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2016.2623982"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrs.2018.2850880"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2017.0468"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3203757"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrs.2023.3246522"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.3040660"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2014.2347913"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.17775\/cseejpes.2016.01400"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2021.121443"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1201\/9781420009248-13"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2741262"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2015.2424983"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tsg.2018.2805839"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2785218"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.eng.2021.06.005"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2016.2645898"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2018.2827361"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2017.2759256"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrs.2018.2850880"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrs.2023.3293016"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11318836\/11153788.pdf?arnumber=11153788","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T18:44:10Z","timestamp":1767206650000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11153788\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":28,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3585029","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,1]]}}}