{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T18:02:46Z","timestamp":1770746566866,"version":"3.49.0"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100007053","name":"Korea Institute of Energy Technology Evaluation and Planning","doi-asserted-by":"crossref","award":["20225500000150"],"award-info":[{"award-number":["20225500000150"]}],"id":[{"id":"10.13039\/501100007053","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/tie.2025.3594420","type":"journal-article","created":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T17:39:28Z","timestamp":1759426768000},"page":"2080-2091","source":"Crossref","is-referenced-by-count":0,"title":["Reclosable Bidirectional Z-Source DC Circuit Breaker Suppressing Source-Side Fault Reflection and Reverse Recovery Spikes"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0286-5289","authenticated-orcid":false,"given":"Min","family":"Gao","sequence":"first","affiliation":[{"name":"Florida State University, Tallahassee, FL, USA"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-4993-2581","authenticated-orcid":false,"given":"Hyun-Mo","family":"Ahn","sequence":"additional","affiliation":[{"name":"Korea Electrotechnology Research Institute, Changwon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0548-1432","authenticated-orcid":false,"given":"Jun-Kyu","family":"Park","sequence":"additional","affiliation":[{"name":"Korea Electrotechnology Research Institute, Changwon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3766-2329","authenticated-orcid":false,"given":"Yeon-Ho","family":"Oh","sequence":"additional","affiliation":[{"name":"Korea Electrotechnology Research Institute, Changwon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-8827-1506","authenticated-orcid":false,"given":"Ki-Dong","family":"Song","sequence":"additional","affiliation":[{"name":"Korea Electrotechnology Research Institute, Changwon, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4433-8607","authenticated-orcid":false,"given":"Jinli","family":"Zhu","sequence":"additional","affiliation":[{"name":"University of Pittsburgh, Pittsburgh, PA, USA"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1331-348X","authenticated-orcid":false,"given":"Jinyeong","family":"Moon","sequence":"additional","affiliation":[{"name":"Florida State University, Tallahassee, FL, USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2464277"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2015.2443119"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/OJPEL.2024.3381000"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3039921"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3262605"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2878191"},{"key":"ref7","first-page":"123","article-title":"Surge current capability of IGBTS used in low voltage dc\/ac hybrid circuit breaker","volume-title":"Proc. 10th Int. Conf. Integr. Power Electron. Syst.","author":"Askan","year":"2018"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCHMT.1986.1136611"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2764863"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2010.5637261"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.808920"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2178125"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2013.6699472"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ESTS.2011.5770893"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2415775"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2624147"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2018.8341608"},{"key":"ref18","article-title":"Passive electronic fuse for protecting a dc application","author":"Saers","year":"2019"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3006889"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3153889"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11385824\/11190068.pdf?arnumber=11190068","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T05:56:44Z","timestamp":1770703004000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11190068\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":20,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3594420","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}