{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T18:53:46Z","timestamp":1767207226115,"version":"3.48.0"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52077087"],"award-info":[{"award-number":["52077087"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,1]]},"DOI":"10.1109\/tie.2025.3594441","type":"journal-article","created":{"date-parts":[[2025,8,19]],"date-time":"2025-08-19T18:16:05Z","timestamp":1755627365000},"page":"242-252","source":"Crossref","is-referenced-by-count":0,"title":["Electromagnetic Vibration Analysis of Homopolar Inductor Machine Considering Field Current Ripple"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4195-2505","authenticated-orcid":false,"given":"Xiaodong","family":"Qi","sequence":"first","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1333-2537","authenticated-orcid":false,"given":"Shouyu","family":"Xu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3111-0870","authenticated-orcid":false,"given":"Caiyong","family":"Ye","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1806-3045","authenticated-orcid":false,"given":"Yi","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1930-4747","authenticated-orcid":false,"given":"Guangdong","family":"Cao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-3558-1884","authenticated-orcid":false,"given":"Kexin","family":"Yao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Electromagnetic Engineering and Technology, School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2459-7669","authenticated-orcid":false,"given":"Yunfeng","family":"Zhao","sequence":"additional","affiliation":[{"name":"National Center for Quality Inspection and Test of Motors, Anhui, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2898577"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2441040"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2842790"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2851989"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2013.2290304"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2720422"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2910046"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3146513"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2593683"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2210172"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2268453"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2081961"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2175714"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2911896"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2022.3172651"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3130323"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3227273"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2038370"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11318836\/11130594.pdf?arnumber=11130594","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T18:44:50Z","timestamp":1767206690000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11130594\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":18,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3594441","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2026,1]]}}}