{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T23:51:24Z","timestamp":1780444284722,"version":"3.54.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Major basic research project of Shandong Province Natural Sciences Fund","award":["ZR2024ZD25"],"award-info":[{"award-number":["ZR2024ZD25"]}]},{"DOI":"10.13039\/501100007129","name":"Natural Science Foundation of Shandong Province","doi-asserted-by":"publisher","award":["ZR2024QE416"],"award-info":[{"award-number":["ZR2024QE416"]}],"id":[{"id":"10.13039\/501100007129","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U22A20218"],"award-info":[{"award-number":["U22A20218"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shandong Province Enterprise Innovation Capacity Improvement Project","award":["2023TSGC0442"],"award-info":[{"award-number":["2023TSGC0442"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/tie.2025.3598194","type":"journal-article","created":{"date-parts":[[2025,10,23]],"date-time":"2025-10-23T17:51:40Z","timestamp":1761241900000},"page":"2801-2812","source":"Crossref","is-referenced-by-count":1,"title":["Research on Fault-Tolerant Control Method and Axial Stress Distribution of a Dual Three-Phase Combined-Core Stator Disk-Type Rotor Permanent Magnet Synchronous Motor"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0593-8482","authenticated-orcid":false,"given":"Wenjing","family":"Zhang","sequence":"first","affiliation":[{"name":"Shandong University, Jinan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8284-4271","authenticated-orcid":false,"given":"Yanliang","family":"Xu","sequence":"additional","affiliation":[{"name":"Shandong University, Jinan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8376-6164","authenticated-orcid":false,"given":"Ngac Ky","family":"Nguyen","sequence":"additional","affiliation":[{"name":"Laboratory of Electrical Engineering and Power Electronics, Arts et Métiers Institute of Technology, Lille, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8565-1707","authenticated-orcid":false,"given":"Eric","family":"Semail","sequence":"additional","affiliation":[{"name":"Laboratory of Electrical Engineering and Power Electronics, Arts et Métiers Institute of Technology, Lille, France"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.2965487"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3393112"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2023.3324944"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.2984422"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3189082"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.3038060"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.3007053"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2020.2989624"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2018.2876400"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2021.3076509"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2024.3385010"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2019.2900599"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2022.3199100"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tte.2023.3288525"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2014.2300034"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2023.3282739"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2739697"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2017.2728796"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2010.2087300"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2024.3397637"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11385824\/11215824.pdf?arnumber=11215824","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T21:05:14Z","timestamp":1770757514000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11215824\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":20,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3598194","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}