{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,15]],"date-time":"2026-07-15T16:27:17Z","timestamp":1784132837552,"version":"3.55.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52577187"],"award-info":[{"award-number":["52577187"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/tie.2025.3600542","type":"journal-article","created":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T17:40:30Z","timestamp":1760722830000},"page":"2240-2251","source":"Crossref","is-referenced-by-count":3,"title":["Integrating WCS, OBC, and APM Systems in Electric Vehicle Charging Systems Based on Multiwinding Couplers and Multifrequency Operation"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-3896-9143","authenticated-orcid":false,"given":"Wei","family":"Xu","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9601-8090","authenticated-orcid":false,"given":"Yuanchao","family":"Wu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Analog and Mixed-Signal VLSI, University of Macau, Macao, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-7210-5811","authenticated-orcid":false,"given":"Ronghuan","family":"Xie","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3212-9821","authenticated-orcid":false,"given":"Yizhan","family":"Zhuang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7923-6731","authenticated-orcid":false,"given":"Xingkui","family":"Mao","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9902-4664","authenticated-orcid":false,"given":"Yiming","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2021.3071977"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.30941\/CESTEMS.2023.00010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.48130\/wpt-0024-0013"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2835307"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3570846"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3353490"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2024.3417002"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3379951"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2955299"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3323473"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3321154"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3516821"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3247767"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2025.3528476"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3462439"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3571803"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3546111"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3204857"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3331132"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3312435"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3103700"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3540516"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3412940"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3063931"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3276048"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2024.3463610"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3297623"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3518499"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CIEEC60922.2024.10583761"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3103700"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3067875"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11385824\/11207094.pdf?arnumber=11207094","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T21:05:36Z","timestamp":1770757536000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11207094\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":31,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3600542","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}