{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,15]],"date-time":"2026-06-15T00:18:37Z","timestamp":1781482717143,"version":"3.54.1"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Research Centre of Unmanned Autonomous Systems (RCUAS) at PolyU"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,3]]},"DOI":"10.1109\/tie.2025.3603058","type":"journal-article","created":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T18:10:20Z","timestamp":1762539020000},"page":"4622-4633","source":"Crossref","is-referenced-by-count":2,"title":["A Fixed-Time Incremental Backstepping-Based Direct Lift Altitude Fault-Tolerant Control for Unilateral Horizontal-Tail-Damaged Aircraft"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1545-6548","authenticated-orcid":false,"given":"Yu","family":"Li","sequence":"first","affiliation":[{"name":"Department of Aeronautical and Aviation Engineering, The Hong Kong Polytechnic University, Hong Kong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1181-8786","authenticated-orcid":false,"given":"Chih-Yung","family":"Wen","sequence":"additional","affiliation":[{"name":"Department of Aeronautical and Aviation Engineering, The Hong Kong Polytechnic University, Hong Kong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9731-5943","authenticated-orcid":false,"given":"Youmin","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Mechanical, Industrial and Aerospace Engineering, Concordia University, Montreal, QC, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2008.03.008"},{"key":"ref2","first-page":"763","article-title":"The Alaska airlines flight 261 accident: A systemic analysis of functional resonance","author":"Woltjer","year":"2007","journal-title":"2007 Int. Symp. Aviation Psychol."},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.1999.827909"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2772153"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3135640"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2965479"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-024-10600-3"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2022.10.021"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2514\/6.2010-500"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.2514\/6.2008-6203"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2023.110907"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.2514\/1.G000432"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2019.105530"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2021.3082663"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.2514\/6.2012-4623"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.2514\/1.61890"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICSP54964.2022.9778601"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2025.3569244"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2921296"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2024.3461677"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3140494"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2703678"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2025.3528508"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2772192"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2019.2952631"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.2514\/1.G005921"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.2514\/6.2019-0110"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.12.013"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2011.2179869"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2021.3103237"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2025.110405"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2016.09.010"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2011.2169796"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2023.108490"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1002\/rnc.6641"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2019.03.001"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.2514\/1.20151"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2024.3523878"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.2514\/1.G001490"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2024.109132"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3153821"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11417365\/11235549.pdf?arnumber=11235549","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T20:55:49Z","timestamp":1772484949000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11235549\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3]]},"references-count":41,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3603058","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,3]]}}}