{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T23:50:26Z","timestamp":1780357826490,"version":"3.54.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62303032"],"award-info":[{"award-number":["62303032"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["42388101"],"award-info":[{"award-number":["42388101"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"2022 Industrial Technology Basic Public Service Platform Project","award":["2022-189-181"],"award-info":[{"award-number":["2022-189-181"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/tie.2025.3613643","type":"journal-article","created":{"date-parts":[[2025,10,29]],"date-time":"2025-10-29T17:35:23Z","timestamp":1761759323000},"page":"3316-3327","source":"Crossref","is-referenced-by-count":1,"title":["High-Precision Nonlinear Spatial Gradient Disturbance Suppression Method for Magnetic Shielding Cylinder"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6930-4000","authenticated-orcid":false,"given":"Haifeng","family":"Zhang","sequence":"first","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-7016-6595","authenticated-orcid":false,"given":"Zhongxiang","family":"Jing","sequence":"additional","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6909-6632","authenticated-orcid":false,"given":"Fengwen","family":"Zhao","sequence":"additional","affiliation":[{"name":"Hangzhou Institute of National Extremely-Weak Magnetic Field Infrastructure, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1631-8318","authenticated-orcid":false,"given":"Xiangyang","family":"Ye","sequence":"additional","affiliation":[{"name":"Hangzhou Institute of National Extremely-Weak Magnetic Field Infrastructure, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0464-2425","authenticated-orcid":false,"given":"Suhang","family":"Li","sequence":"additional","affiliation":[{"name":"Hangzhou Institute of National Extremely-Weak Magnetic Field Infrastructure, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-5266-5038","authenticated-orcid":false,"given":"Yunyang","family":"Lian","sequence":"additional","affiliation":[{"name":"Hangzhou Institute of National Extremely-Weak Magnetic Field Infrastructure, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7636-7712","authenticated-orcid":false,"given":"Gang","family":"Liu","sequence":"additional","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1161\/jaha.122.027619"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2025.3562994"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/s42254-023-00558-3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2025.3555703"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.adg1746"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jbhi.2025.3584984"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113904"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2025.3545841"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3159961"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3352166"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.5036605"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ac74f5"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3341108"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.5066250"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2024.114948"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3075445"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2025.3545997"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3409895"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2025.116818"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2024.3353928"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2025.3597720"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2019.03.022"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/icemi59194.2023.10270404"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3394482"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3404152"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/tase.2025.3592993"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2025.3538134"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2024.115548"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2018.2840495"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2023.3345465"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3401183"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11385824\/11220881.pdf?arnumber=11220881","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T21:05:06Z","timestamp":1770757506000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11220881\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":31,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3613643","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}