{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T22:03:59Z","timestamp":1772489039016,"version":"3.50.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52025073"],"award-info":[{"award-number":["52025073"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52377055"],"award-info":[{"award-number":["52377055"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Postgraduate Research & Practice Innovation Program of Jiangsu Province","award":["SJCX22_1866"],"award-info":[{"award-number":["SJCX22_1866"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,3]]},"DOI":"10.1109\/tie.2025.3616432","type":"journal-article","created":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T18:10:20Z","timestamp":1762539020000},"page":"4552-4562","source":"Crossref","is-referenced-by-count":0,"title":["Carrier Phase Shift Control to Reduce Iron Loss in Nine-Phase Cobalt\u2013Iron PMSMs"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-9398-2825","authenticated-orcid":false,"given":"Tianyu","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4444-6595","authenticated-orcid":false,"given":"Wenxiang","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Electric Power Engineering, Nanjing Institute of Technology, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5127-4402","authenticated-orcid":false,"given":"Tao","family":"Tao","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3611-2237","authenticated-orcid":false,"given":"Huanan","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0425-8108","authenticated-orcid":false,"given":"Yi","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Jiangsu University, Zhenjiang, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3482013"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/CJEE.2025.000141"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3468630"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3436682"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3423441"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3223636"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2587815"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2024.3436815"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3012018"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2024.3428437"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3027864"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3307237"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3438936"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.3034888"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3383051"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3413836"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3281743"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2023.3266491"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2024.3379981"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2941991"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3009824"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2024.3491036"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3330934"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3187679"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2910311"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2317072"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3098824"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2025.3584771"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3371186"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3426564"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11417365\/11235543.pdf?arnumber=11235543","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T20:55:47Z","timestamp":1772484947000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11235543\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3]]},"references-count":30,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3616432","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,3]]}}}