{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T17:35:34Z","timestamp":1777656934013,"version":"3.51.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52204263"],"award-info":[{"award-number":["52204263"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,4]]},"DOI":"10.1109\/tie.2025.3626613","type":"journal-article","created":{"date-parts":[[2025,12,19]],"date-time":"2025-12-19T18:58:35Z","timestamp":1766170715000},"page":"5906-5917","source":"Crossref","is-referenced-by-count":2,"title":["Robust Cubature Kalman Filter Based on Mahalanobis Distance for Sensorless Control of Switched Reluctance Motor"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-3427-3007","authenticated-orcid":false,"given":"Xi","family":"Wang","sequence":"first","affiliation":[{"name":"School of Automation, Northwestern Polytechnical University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-8098-9378","authenticated-orcid":false,"given":"Jingzhou","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Automation, Northwestern Polytechnical University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3779-7618","authenticated-orcid":false,"given":"Wei","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Cybersecurity, Northwestern Polytechnical University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1770-1589","authenticated-orcid":false,"given":"Hongyi","family":"Nie","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Northwestern Polytechnical University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1654-3400","authenticated-orcid":false,"given":"Shiqi","family":"Fan","sequence":"additional","affiliation":[{"name":"School of Cybersecurity, Northwestern Polytechnical University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3264-6215","authenticated-orcid":false,"given":"Xiaohua","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Automation, Northwestern Polytechnical University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3452171"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2023.3349283"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3265035"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3110867"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2156751"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3273278"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3183275"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3474680"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ESARS-ITEC60450.2024.10819924"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2070471"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2024.3401483"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/SCSET58950.2023.00146"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3398685"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jestpe.2025.3595924"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2017.2672523"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2016.7521741"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2018.8352231"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/ip-f-2.1993.0015"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/9.847726"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.823141"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2009.2019800"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1631\/FITEE.1500262"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2022.3146800"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1049\/ip-epa:20045207"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3299895"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2517924"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11447357\/11304749.pdf?arnumber=11304749","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,23]],"date-time":"2026-03-23T20:07:51Z","timestamp":1774296471000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11304749\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4]]},"references-count":26,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3626613","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,4]]}}}