{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,21]],"date-time":"2026-04-21T14:49:53Z","timestamp":1776782993204,"version":"3.51.2"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,5]]},"DOI":"10.1109\/tie.2025.3626633","type":"journal-article","created":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T18:38:05Z","timestamp":1767119885000},"page":"7214-7224","source":"Crossref","is-referenced-by-count":1,"title":["Motion Reproduction System for Environmental Impedance Variation via Data-Driven Identification of Human Stiffness"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-5224-2979","authenticated-orcid":false,"given":"Akira","family":"Takakura","sequence":"first","affiliation":[{"name":"Nozaki Laboratory, Graduate School of Science and Engineering, Keio University, Yokohama, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-3742-3584","authenticated-orcid":false,"given":"Kazuki","family":"Yane","sequence":"additional","affiliation":[{"name":"Nozaki Laboratory, Graduate School of Science and Engineering, Keio University, Yokohama, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6150-0362","authenticated-orcid":false,"given":"Tomoya","family":"Kitamura","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Faculty of Science and Technology, Tokyo University of Science, Noda, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3381-2622","authenticated-orcid":false,"given":"Shuichi","family":"Adachi","sequence":"additional","affiliation":[{"name":"Haptics Research Center, Keio University, Yokohama, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2558-9822","authenticated-orcid":false,"given":"Takahiro","family":"Nozaki","sequence":"additional","affiliation":[{"name":"Department of System Design Engineering, Keio University, Yokohama, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3471672"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3192690"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3468636"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2025.3532733"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3344831"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3401185"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2020.3011353"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2027927"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3543618"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2023.3329622"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2024.3433435"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2019.2928760"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3250746"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2025.3558080"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1541\/ieejjia.24005263"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.37188\/lam.2024.012"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1541\/ieejjia.5.221"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2018.8433747"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICM62621.2025.10934905"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/0304-4076(88)90077-2"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2025.3589470"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3196379"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/41.222648"},{"key":"ref24","volume-title":"Principles of Regression Analysis.","author":"Plackett","year":"1960"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1987.1057307"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(81)90070-4"},{"key":"ref27","first-page":"514","article-title":"Gaussian processes for regression","author":"Williams","year":"1996","journal-title":"Proc. Adv. Neural. Inf. Process. Syst."},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.2172\/4390578"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/57.1.97"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.23919\/ACC.1984.4788393"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2025.3561861"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3419177"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2189537"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11474704\/11319205.pdf?arnumber=11319205","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T19:57:10Z","timestamp":1775505430000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11319205\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5]]},"references-count":33,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3626633","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,5]]}}}