{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T19:03:56Z","timestamp":1777921436473,"version":"3.51.4"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"CAS Project for Young Scientists in Basic Research","award":["YSBR-102"],"award-info":[{"award-number":["YSBR-102"]}]},{"name":"Chinese Academy of Sciences Key Scientific Research Projects","award":["KGFZD-145-23-54-4"],"award-info":[{"award-number":["KGFZD-145-23-54-4"]}]},{"DOI":"10.13039\/100031511","name":"Institute of Electrical Engineering, CAS","doi-asserted-by":"crossref","award":["E155610201"],"award-info":[{"award-number":["E155610201"]}],"id":[{"id":"10.13039\/100031511","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100004739","name":"Youth Innovation Promotion Association, CAS","doi-asserted-by":"crossref","award":["2020144"],"award-info":[{"award-number":["2020144"]}],"id":[{"id":"10.13039\/501100004739","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1109\/tie.2025.3629339","type":"journal-article","created":{"date-parts":[[2026,1,21]],"date-time":"2026-01-21T21:09:48Z","timestamp":1769029788000},"page":"8555-8566","source":"Crossref","is-referenced-by-count":0,"title":["A Reliable Dynamically Reconfigurable Battery Topology Family and Hybrid Control Strategy Suitable for Multiple Operating Conditions"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-6897-0862","authenticated-orcid":false,"given":"Meng","family":"Wei","sequence":"first","affiliation":[{"name":"State Key Laboratory of High Density Electromagnetic Power and Systems, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9008-6909","authenticated-orcid":false,"given":"Jingyuan","family":"Yin","sequence":"additional","affiliation":[{"name":"State Key Laboratory of High Density Electromagnetic Power and Systems, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3979-3864","authenticated-orcid":false,"given":"Guoning","family":"Xu","sequence":"additional","affiliation":[{"name":"Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-0585-5710","authenticated-orcid":false,"given":"Zhuohan","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of High Density Electromagnetic Power and Systems, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-5886-1794","authenticated-orcid":false,"given":"Jinkai","family":"Peng","sequence":"additional","affiliation":[{"name":"State Key Laboratory of High Density Electromagnetic Power and Systems, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6351-862X","authenticated-orcid":false,"given":"Qunhai","family":"Huo","sequence":"additional","affiliation":[{"name":"State Key Laboratory of High Density Electromagnetic Power and Systems, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8045-9361","authenticated-orcid":false,"given":"Tongzhen","family":"Wei","sequence":"additional","affiliation":[{"name":"State Key Laboratory of High Density Electromagnetic Power and Systems, Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/CAC59555.2023.10451705"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MetroAeroSpace51421.2021.9511752"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2024.109266"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2020.2991806"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2024.110853"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2020.115408"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2019.03.002"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3263809"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3049573"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3239416"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3389\/fenrg.2023.1298694"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2019.8927717"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2020.3002486"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/app13021154"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3152005"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3406444"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2020.2995308"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3142406"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.geits.2025.100282"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.geits.2023.100128"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IMCEC55388.2022.10020015"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3012230"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ITEC55900.2023.10187040"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3291675"},{"key":"ref25","volume-title":"Handbook of Reliability Prediction of Electronic Equipment","year":"2006"},{"key":"ref26","volume-title":"Military Handbook-Reliability Prediction of Electronic Equipment","year":"1991"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/QR2MSE.2013.6625547"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2922206"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2192503"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/APSIPAASC58517.2023.10317341"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3333012"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11503074\/11360099.pdf?arnumber=11360099","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T19:54:11Z","timestamp":1777665251000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11360099\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":31,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3629339","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,6]]}}}