{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T21:46:05Z","timestamp":1774043165858,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T00:00:00Z","timestamp":1775001600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2026,4]]},"DOI":"10.1109\/tie.2025.3629369","type":"journal-article","created":{"date-parts":[[2025,12,5]],"date-time":"2025-12-05T18:38:02Z","timestamp":1764959882000},"page":"6178-6188","source":"Crossref","is-referenced-by-count":0,"title":["Adaptive Extended Disturbance Observer-Based Control for Quadrotor Landing on Fast Platform"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-2678-1805","authenticated-orcid":false,"given":"Yufei","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7746-4589","authenticated-orcid":false,"given":"Zhong","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3310014"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1017\/S0263574721001181"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1177\/10775463251347061"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2023.3263558"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3129486"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10846-016-0339-y"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10846-021-01391-5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2024.3377810"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2022.105288"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.2514\/1.G002703"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-020-05915-w"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3197181"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3268439"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2022.03.024"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/asi7020022"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2024.3363372"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2023.123108"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2022.3180506"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3224167"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.oceaneng.2023.113775"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIV.2024.3382207"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIV.2024.3376954"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3472025"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2022.3204105"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.1984.310438"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/lcsys.2021.3085963"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2020.3019831"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1142\/S2301385023310015"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.2514\/1.C036974"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3140494"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3066643"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3433585"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3194190"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/41\/11447357\/11278809.pdf?arnumber=11278809","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T19:59:03Z","timestamp":1774036743000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11278809\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4]]},"references-count":33,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2025.3629369","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,4]]}}}